Bit-Error Detection in Test Instruments Using Reference Sequence Sync

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Solution Overview

Problem

Test and measurement instruments, such as oscilloscopes and logic analyzers, face challenges in accurately detecting bit errors in digitized data, which can be masked within error-free data, hindering effective analysis and acquisition.

Innovation Solution

A test and measurement instrument comprising an input to receive signals, a memory to store reference digitized data, a pattern detector to generate synchronization signals upon matching the reference sequence, and a comparator to compare the reference data with the input data, enabling bit-error detection and analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional test and measurement instruments display digitized data, then data visualization is achieved, but bit errors are masked within error-free data making detection difficult

Engineering Contradiction:

Improvebit error detection precisionVSAvoidbit error detection difficulty

Core Design Contradiction:

Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent extracts bit error detection capability from conventional display-only instruments by adding a pattern detector that identifies reference sequences and a comparator that compares received data against reference data, separating error detection functionality from general data visualization

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces an intermediary error detection mechanism between the input signal and display output, using pattern detectors and comparators as intermediate components to identify and flag bit errors before data is displayed to the user

Inventive Principle:

Principle #24Intermediary (Mediator)

2Productivity

If test and measurement instruments analyze digitized data without error detection, then data processing is simple, but error analysis and acquisition are hindered

Engineering Contradiction:

Improvedata acquisition efficiencyVSAvoiddata analysis reliability

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

The patent performs preliminary error detection by comparing incoming digitized data against stored reference data before the data is fully processed or displayed, allowing errors to be identified and flagged in advance during the data acquisition process

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback by using pattern detectors to identify reference sequences in received data and comparators to compare this data against reference data, providing feedback signals that indicate detected errors and enable corrective actions or re-acquisitions

Inventive Principle:

Principle #23Feedback

Data Source

PatentUS20110041047A1Test and measurement instrument with bit-error detection

Publication Date: 2011.02.17 TEKTRONIX INC

AI summary

A test and measurement instrument including an input configured to receive a signal and output digitized data; a memory configured to store reference digitized data including a reference sequence; a pattern detector configured to detect the reference sequence in the digitized data and generate a synchronization signal in response; a memory controller configured to cause the memory to output the reference digitized data in response to the synchronization signal; and a comparator configured to compare the reference digitized data output from the memory to the digitized data.