Bit Line Sense Amplifier Layout for Semiconductor Memory

Solution Overview

Problem

Conventional semiconductor memory devices face performance limitations due to shared active regions among bit line sense amplifiers, which can affect data sensing accuracy and efficiency.

Innovation Solution

A layout structure for bit line sense amplifiers in semiconductor memory devices is designed such that transistors forming different amplifiers either share or do not share active regions based on their control by common or different column selection line signals, optimizing their arrangement to prevent data sensing errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If adjacent transistors forming different bit line sense amplifiers share an active region, then device complexity is reduced and area is minimized, but sensing precision and reliability deteriorate due to data sensing errors

Engineering Contradiction:

ImproveareaVSAvoidsensing precision

Core Design Contradiction:

Area of stationary objectVSMeasurement precision

Solution Approach 1:

The patent segments the active region allocation based on column selection line control groups. Transistors controlled by the same column selection line signal are assigned separate active regions, while transistors controlled by different signals can share active regions. This segmentation resolves the contradiction by allowing area optimization through sharing where safe, while maintaining sensing precision through separation where needed.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by differentiating active region sharing policies based on the specific control signal groups involved. Rather than uniformly separating or sharing all adjacent transistors, the layout selectively applies sharing only to transistors controlled by different column selection line signals, while maintaining separation for those controlled by the same signal. This localized approach optimizes area without compromising sensing precision.

Inventive Principle:

Principle #3Local quality

2Area of stationary object

If adjacent transistors forming different bit line sense amplifiers share an active region, then manufacturing area is minimized, but reliability deteriorates due to potential data sensing errors

Engineering Contradiction:

ImproveareaVSAvoidreliability

Core Design Contradiction:

Area of stationary objectVSReliability

Solution Approach 1:

The patent segments the active region allocation based on column selection line control groups. Transistors controlled by the same column selection line signal are assigned separate active regions, while transistors controlled by different signals can share active regions. This segmentation resolves the contradiction by allowing area optimization through sharing where safe, while maintaining sensing precision through separation where needed.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by differentiating active region sharing policies based on the specific control signal groups involved. Rather than uniformly separating or sharing all adjacent transistors, the layout selectively applies sharing only to transistors controlled by different column selection line signals, while maintaining separation for those controlled by the same signal. This localized approach optimizes area without compromising sensing precision.

Inventive Principle:

Principle #3Local quality

3Reliability

If all transistors are separated to avoid data sensing errors, then sensing reliability is improved, but device area and complexity increase

Engineering Contradiction:

Improvesensing reliabilityVSAvoidarea

Core Design Contradiction:

ReliabilityVSArea of stationary object

Solution Approach 1:

The patent segments the active region allocation based on column selection line control groups. Transistors controlled by the same column selection line signal are assigned separate active regions, while transistors controlled by different signals can share active regions. This segmentation resolves the contradiction by allowing area optimization through sharing where safe, while maintaining sensing precision through separation where needed.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by differentiating active region sharing policies based on the specific control signal groups involved. Rather than uniformly separating or sharing all adjacent transistors, the layout selectively applies sharing only to transistors controlled by different column selection line signals, while maintaining separation for those controlled by the same signal. This localized approach optimizes area without compromising sensing precision.

Inventive Principle:

Principle #3Local quality

Data Source

PatentUS8310853B2Layout structure of bit line sense amplifiers for a semiconductor memory device

Publication Date: 2012.11.13 SAMSUNG ELECTRONICS CO LTD

AI summary

A layout structure of bit line sense amplifiers for use in a semiconductor memory device includes first and second bit line sense amplifiers arranged to share and be electrically controlled by a first column selection line signal, and each including a plurality of transistors. In this layout structure, each of the plurality of transistors forming the first bit line sense amplifier is arranged so as not to share an active region with any transistors forming the second bit line sense amplifier.