Current Control Apparatus for BJT Temperature Measurement

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Solution Overview

Problem

The dual current mode temperature measurement method for bipolar junction transistors (BJTs) is prone to errors due to variations in the β value, which affect the ratio between collector currents, leading to inaccurate temperature measurements.

Innovation Solution

A current control apparatus comprising a current control module, first and second current mirror modules, a current subtractor, and a current adjusting module, which generates and adjusts currents to maintain predetermined ratios, thereby stabilizing temperature measurement by applying a current control signal to the BJT's terminals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the dual current mode temperature measurement method is used to measure the temperature of the BJT, then the temperature can be measured, but temperature measurement errors occur when the β value becomes smaller and varies according to current variation

Engineering Contradiction:
Improvetemperature measurement accuracyVSAvoidmeasurement reliability under process variation
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent changes the measurement parameters by introducing current mirror modules that create fixed current ratios, transforming the measurement approach from direct collector current ratio to controlled current mirror ratio, which remains stable despite β variations

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces current mirror modules as intermediary components between the measurement system and the BJT. These modules act as mediators that enforce fixed current ratios, isolating the measurement from the effects of β variation and enabling accurate temperature measurement

Inventive Principle:
Principle #24Intermediary (Mediator)

2Volume of moving object

If advanced process technology is used to reduce transistor size, then device scaling is achieved, but the β value becomes smaller and more variable

Engineering Contradiction:
Improvetransistor sizeVSAvoidβ value stability
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

The patent compensates for the deteriorating β characteristics in advanced processes by changing the measurement parameter from direct collector current to controlled current mirror output, which maintains stable ratios independent of β variations

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The current mirror modules provide a form of feedback control where the output currents are automatically adjusted to maintain fixed ratios with the reference currents, compensating for process variations and ensuring measurement accuracy in scaled devices

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS7705661B2Current control apparatus applied to transistor
Publication Date: 2010.04.27 FEATURE INTEGRATION TECH INC
  • US7705661B2 patent drawing
  • US7705661B2 patent drawing
  • US7705661B2 patent drawing

AI summary

The present invention provides a current control apparatus applied to a transistor. The transistor has a control terminal, a first terminal, and a second terminal. The current control apparatus includes a current control module, a first current mirror module, a second current mirror module, a current subtractor, and a current adjusting module. The current control apparatus provided by the present invention can be applied to a bipolar junction transistor (BJT) to prevent temperature measurement errors from occurring when using a dual current mode temperature measurement method to measure the temperature of the BJT.