Black Box Model for Large Signal Transient IC Simulation
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Solution Overview
Problem
Current integrated circuit simulation models are limited in their ability to perform large signal frequency analysis and general transient analysis, particularly for power simulations, due to their reliance on detailed device physics or 'black box' approaches that require extensive parameter extraction or large computer resources, respectively.
Innovation Solution
A 'black box' approach utilizing look-up tables and 'reactive tails' is employed to simulate integrated circuit devices, where probe pulses are applied to each terminal to record reactions, storing these reactions in a look-up table for efficient simulation across various device types, including traditional MOS and bipolar transistors, and new devices like power inductors, enabling auto-generated RTM of sub-circuit blocks.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a detailed device physics model is used, then measurement precision is improved, but device complexity increases and parameter extraction becomes time-consuming
Solution Approach 1:
The patent creates a behavioral model that copies the external electrical characteristics (I-V, C-V, L-V curves) of the device without replicating its internal physics structure. This look-up table approach stores measured characteristic curves directly, providing accurate simulation results while avoiding the complexity of detailed physics models and manual parameter extraction.
2Device complexity
If a black box approach with look-up tables is used, then device complexity is reduced, but computer resources required increase
Solution Approach 1:
The patent segments the device behavior into distinct operating regions and represents each region with compact behavioral equations rather than storing complete look-up tables for all conditions. This segmentation allows the model to use minimal memory while maintaining accuracy across the full operating range by calculating behavior on-demand based on regional characteristics.
3Measurement precision
If frequency-dependent model parameters are used, then measurement precision is improved for DC and small signal analysis, but applicability to large signal and transient analysis is lost
Solution Approach 1:
The patent develops a universal behavioral model that functions across multiple analysis types (DC, small signal AC, large signal AC, and transient analysis) by using voltage and current as fundamental variables with time-dependent behavioral equations. This multi-functional approach eliminates the need for separate frequency-dependent models for different analysis types, allowing the same model structure to serve all simulation purposes.
Data Source
AI summary
A method of simulating an integrated circuit device under test (DUT) is provided, wherein the DUT includes a plurality of terminals. For each terminal of the DUT, a probe pulse is applied to the terminal and a reaction is recorded at the terminal and each of the other terminals to obtain values representative of reactive tails for the terminal. For each terminal, the values representative of the reactive tails obtained for the terminal are stored as an entry of a look-up table. Each entry includes n+x fields, wherein n represents a number of arguments in the entry and x represents a number of functions in the entry. For each terminal, a signal value at a selected time step is calculated.