Bleeder Circuits for Stabilizing Floating Column Selection Lines

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Solution Overview

Problem

In semiconductor memory devices, broken Y-address selection wires can go undetected during manufacturing, leading to data reliability issues due to signal disconnection, which existing redundancy techniques may not fully address, especially when the broken wire is electrically floating and affects local input/output lines.

Innovation Solution

The implementation of CS bleeder circuits that stabilize the voltage of defective column selection lines by coupling CS bleeder transistors to YS transistors via a YS transistor channel, ensuring a stable voltage even when the column selection line is open, thereby preventing data overwrites.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If redundancy wires for address lines are introduced to replace broken wires, then data reliability is improved, but the electrically floating state of broken YS wires can still cause data overwrites on local input/output lines

Engineering Contradiction:
Improvedata reliabilityVSAvoiddata overwrite due to floating state
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

A pull-down resistor is introduced as an intermediary component connected between the column selection line and ground. This resistor acts as a mediator that provides a controlled electrical path to stabilize the floating potential of broken YS wires, preventing them from assuming random voltage levels that could cause data overwrites while maintaining the redundancy wire structure

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The invention converts the harmful effect of the electrically floating broken wire into a beneficial stabilization mechanism. By intentionally adding a pull-down resistor, the floating state that causes random voltage levels is transformed into a controlled state where the resistor actively pulls the voltage to a known low level, preventing data corruption

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Device complexity

If the broken YS wire is left in electrically floating state, then manufacturing complexity is reduced, but voltage instability causes data overwrites and reliability issues

Engineering Contradiction:
Improvemanufacturing complexityVSAvoiddata reliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The solution segments the column selection line into two independent parts: the main signal path and the stabilization path. The pull-down resistor is connected only to the portion of the line that may become floating due to breaks, providing localized stabilization without affecting the overall signal integrity or requiring complete redesign of the address line architecture

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The pull-down resistor is a simple, inexpensive passive component that provides effective stabilization. It is a basic electronic component that can be easily integrated into the existing memory structure without adding significant complexity, serving as a low-cost solution to the floating wire problem

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Data Source

PatentUS10339980B2Apparatuses and methods for controlling wordlines and sense amplifiers
Publication Date: 2019.07.02 MICRON TECHNOLOGY INC
  • US10339980B2 patent drawing
  • US10339980B2 patent drawing
  • US10339980B2 patent drawing

AI summary

Apparatuses for controlling defective bit lines in a semiconductor device are described. An example apparatus includes: a first region including a plurality of bit lines, a plurality of word lines and a plurality of memory cells, each memory cell is coupled to an associated bit line and an associated word line; a second region including a plurality of sense amplifiers, each sense amplifier includes a sense node and a column selection switch coupled to the sense node; a third region including a plurality of bleeder circuits, and disposed between the first and second regions; and a plurality of column selection lines. Each bit line from the first region to the second region is coupled to the sense node of an associated one of the plurality of sense amplifiers, and each column selection line from the column selection switch is coupled to an associated bleeder circuit.