Microchip with Blind Holes for Infrared Detection
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Solution Overview
Problem
Current methods fail to effectively detect and locate sources of slightly elevated temperatures, which can indicate defects in machines, cancer in living organisms, or other hidden temperature anomalies, especially when the temperature increase is subtle and spread over a wide area.
Innovation Solution
A microchip with a rough glass or insulating plate surface featuring blind holes filled with semiconducting crystals that emit electrons upon infrared light exposure, connected by thin wires to collect and transmit the electrons for measurement, surrounded by a conductive polymer and potentially a metal coating, allowing for the detection of weak infrared radiation and temperature anomalies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If a continuous film of light detecting material is used, then the detection area is large, but the precision to locate specific temperature sources deteriorates
Solution Approach 1:
The continuous film of light detecting material is divided into multiple independent detection elements arranged in a matrix. Each element can independently detect infrared radiation from a specific spatial location, enabling both large-area coverage and precise localization of temperature sources through the spatial distribution of detection signals across the matrix elements.
2Difficulty of detecting and measuring
If a rough surface with blind holes is used, then the infrared radiation absorption is improved, but the manufacturing complexity increases
Solution Approach 1:
A rough surface layer with numerous blind holes is formed on the front surface of the detection element. This porous structure increases the surface area for infrared radiation absorption and traps incoming radiation within the holes, enhancing detection capability. The blind holes can be manufactured using standard techniques such as laser drilling or chemical etching, making the complex structure manufacturable.
3Measurement precision
If semiconducting crystals are used to convert infrared radiation to electrons, then the detection sensitivity is improved, but the device complexity increases
Solution Approach 1:
Semiconducting crystals are selectively positioned at the bottom of blind holes in the rough surface layer, where they directly convert incident infrared radiation into electrical signals. This localized placement of high-sensitivity materials only where needed maximizes detection sensitivity while minimizing the overall complexity of the device structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise detection and localization of temperature anomalies, such as early cancer detection and machine defects, by converting infrared radiation into measurable electron energy, even in cases of low radiation intensity.
Implementation Method 1
little semiconducting crystals of a kind of material that emitts one or more electrons by each hit of an infrared light beam
Data Source
Figure 1~5
AI summary
The invention relates to a method for the detection of poor rays of infrared wavelength, to a microchip that is able to detect poor infrared rays and to an apparatus working with these microchips. The invention gives a possibility to detect and to locate little growings cancers and others hidden places of parts of a machine with increased temperature. The invention does do it with a special microchip which is able to change photons in electrons. This microchip of the invention consists of a plate of glas or an other insulating material with a rough surface on the one side. The front surface of this plate is rough by a plurality of blind holes, the ground of each of theese blind holes is covered with a thin layer of metal, in each of the blind holes are located little crystals of a kind of material that emitts one or more electrons by each hit of an infrared light beam, the surface of this plate and the blind holes are covered with a net of very thin wires and the active part of this net of very thin wires has on its ends rails of metal to collect and transmit the electrons to a measuring instrument.