Block Copolymer Self-Assembly for High-Density MRAM

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Solution Overview

Problem

Photolithographic processes have physical limitations that restrict the reduction of feature size and pitch in magnetic random access memory (MRAM) arrays, limiting data density in magnetic memory elements.

Innovation Solution

A method involving the deposition of a pillar element material, a hard mask layer, and a chemical template, followed by the use of a block copolymer material to form ordered cylindrical pillars at a density greater than possible with photolithography, allowing for smaller feature sizes and increased data density by patterning the underlying layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If photolithographic processes are used to pattern magnetic memory elements, then manufacturing simplicity is maintained, but data density is limited due to physical limitations on feature size and pitch reduction

Engineering Contradiction:
Improvedata densityVSAvoidfeature size limitation
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

A chemical template layer is introduced as an intermediary between the photolithographic mask and the block copolymer self-assembly process. The template layer with controlled spacing guides the formation of high-density pillar patterns, enabling density multiplication while maintaining manufacturing simplicity through a hybrid approach that combines photolithography with self-assembly

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The block copolymer material performs self-assembly to form ordered cylindrical pillars at densities several times greater than photolithographic limits. The system uses the natural periodicity of the block copolymer to automatically generate the high-density pattern without requiring direct photolithographic patterning at that scale

Inventive Principle:
Principle #25Self-service

2Quantity of substance

If feature size is reduced to increase data density, then data density improves, but manufacturing precision becomes more difficult to achieve with traditional photolithography

Engineering Contradiction:
Improvedata densityVSAvoidmanufacturing difficulty
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The block copolymer system performs self-assembly to form the fine-pitch patterns automatically, eliminating the need for advanced photolithographic tools. The self-organizing nature of block copolymers creates ordered structures at length scales that are difficult or impossible to achieve with conventional lithography, thereby easing manufacturing while achieving high density

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The invention changes the fundamental parameter from direct photolithographic patterning to a two-stage process: first creating a chemical template with larger spacing, then using block copolymer self-assembly to generate the final fine-pitch pattern. This parameter transformation enables access to smaller feature sizes without proportionally increasing manufacturing difficulty

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the formation of magnetic memory elements at a density several times greater than achievable with photolithography, overcoming the limitations of traditional photolithographic processes and significantly increasing data density in MRAM arrays.

Implementation Method 1

block copolymer self assembly

Methodology Applied
Scientific EffectSelf-assembly: Self-Assembly

Implementation Method 2

chemically guided block copolymer self assembly

Methodology Applied
Scientific EffectChemical guidance: Chemical Bonding

Data Source

PatentUS10312435B1Method for manufacturing high density magnetic tunnel junction devices using photolithographic VIAS and chemically guided block copolymer self assembly
Publication Date: 2019.06.04 INTEGRATED SILICON SOLUTION CAYMAN INC
  • US10312435B1 patent drawing
  • US10312435B1 patent drawing
  • US10312435B1 patent drawing

AI summary

A method for manufacturing a magnetic random access memory array at a density greater than would be possible using photolithography. A hard mask material is deposited over a magnetic memory element material, and a chemical template layer such as brush or mat material is deposited over the hard mask. A mask structure is formed over the soluble polymer. The mask structure is configured with openings having a center to center spacing that is an integer multiple of a block copolymer material. The openings in the mask structure can be shrunk by depositing a spacer material. The chemical template layer is chemically patterned, such as by a quick plasma exposure and the mask is removed. A block copolymer material is then deposited over the chemical template and annealed to form block copolymer cylinders that are located over the patterned portions of the chemical template and between the patterned portions.