Block Status Data Reset via OTP Memory Backup
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Solution Overview
Problem
Memory devices face issues with latch upset events, such as neutron strikes, which can incorrectly tag memory blocks as bad, leading to errors and inability to access valid data.
Innovation Solution
Storing block status data in an additional one-time programming (OTP) memory device allows for resetting the block status data when latch upset events occur, ensuring data validity by comparing OTP data with latches and controller data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If block status data is stored in latches within the memory device, then data access speed is improved, but reliability deteriorates due to latch upset events from neutron strikes
Solution Approach 1:
The patent creates a copy of the block status data in a separate OTP memory device that is immune to latch upset events. The controller compares the latch data with the OTP data and uses the OTP data to reset the latch data when discrepancies are detected, thereby maintaining both fast access and reliability.
Solution Approach 2:
The OTP memory device acts as an intermediary that stores a protected copy of the block status data. When latch upset events occur, the OTP data serves as a mediator to correct the corrupted latch data, ensuring data integrity without affecting the primary fast-access latch storage.
2Reliability
If block status data is stored in additional OTP memory device, then reliability is improved, but device complexity increases
Solution Approach 1:
The OTP memory device serves multiple functions: it stores a backup copy of block status data, provides a reference for detecting latch upset events, and enables automatic correction of corrupted data. This multi-functionality justifies the added complexity by providing comprehensive protection against latch failures.
Solution Approach 2:
The system implements a feedback mechanism where the controller continuously compares the latch-stored block status data with the OTP-stored data. When discrepancies are detected indicating latch upset events, the system automatically uses the OTP data to reset the latch data, creating a self-correcting feedback loop that maintains reliability.
3Device complexity
If latch upset events are not corrected, then device complexity is reduced, but loss of information increases due to inability to access valid data
Solution Approach 1:
The OTP memory device stores a preliminary backup copy of the block status data before any latch upset events occur. This advance preparation ensures that when latch failures happen, valid data is already available in the OTP device to immediately correct the corrupted latch data, preventing information loss.
Solution Approach 2:
The system creates a redundant copy of the block status data in the OTP memory device. When latch upset events cause data corruption, this copy provides the original valid data needed to restore correct block status information, thereby preventing loss of information about which blocks are good or bad.
Data Source
AI summary
Apparatuses, systems, and methods for block status data reset are described. An example method includes sending a command, from a controller, to access at least one block of a first memory device. The example method further comprises receiving a failure message from the first memory device due to the at least one block being tagged as a bad block in block status data of the first memory device. The example method further comprises in response to receiving the failure message, resetting the block status data by reloading previously stored block status data from a second memory device.