Blockchain Test Data Sharing for Manufacturing Efficiency

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Solution Overview

Problem

In manufacturing processes, duplicate tests are frequently performed across different integration points despite unchanged modules, leading to increased production costs and inefficiencies, as existing systems lack effective coordination for sharing and optimizing testing data across various organizations.

Innovation Solution

A system utilizing a blockchain ledger for managing and sharing test data across suppliers, board level, and assembly test systems, employing AI-based classification to identify redundant tests and optimize the manufacturing cycle by generating a similarity index and weighting factors for internal and external criteria.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If tests are performed by different organizations at different integration points, then test coverage is improved, but duplicate testing occurs and production costs increase

Engineering Contradiction:
Improvetest coverageVSAvoidproduction efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent merges test data from multiple independent organizations into a unified blockchain ledger, allowing all participants to access and share test results. This combination eliminates duplicate testing while maintaining comprehensive test coverage across different integration points in the manufacturing process.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The blockchain-based test data sharing system serves multiple organizations and test types universally. A single test result stored on the blockchain can be accessed and utilized by any participating organization, making the testing system multi-functional and eliminating the need for separate testing at each organization.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If tests are performed by different organizations, then comprehensive testing is achieved, but data sharing becomes difficult or impossible

Engineering Contradiction:
Improvetest coverageVSAvoidtest data accessibility
Core Design Contradiction:
ReliabilityVSLoss of information

Solution Approach 1:

The blockchain ledger acts as a neutral intermediary that enables data sharing between organizations that would otherwise be unable to exchange information. Each organization maintains control of their own test data while the blockchain provides a trusted mechanism for secure access and verification by all participants.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system segments test data into discrete, traceable units on the blockchain, allowing selective sharing and access control. Each test result is independently recorded and can be accessed by authorized organizations without requiring direct coordination between them.

Inventive Principle:
Principle #1Segmentation

3Reliability

If duplicate tests are performed, then test thoroughness is maintained, but production costs and time increase

Engineering Contradiction:
Improvetest accuracyVSAvoidmanufacturing cycle time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

Test results are recorded and made available on the blockchain at the earliest possible point in the manufacturing process. Subsequent organizations can access these preliminary test results and eliminate redundant testing, performing only the specific tests needed for their integration point rather than repeating full test suites.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system provides real-time feedback about test results through the blockchain ledger. When a component passes testing at one organization, this information is immediately available to subsequent organizations, allowing them to adjust their testing strategy and avoid unnecessary duplicate tests while maintaining quality assurance.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS11119877B2Component life cycle test categorization and optimization
Publication Date: 2021.09.14 DELL PROD LP
  • US11119877B2 patent drawing
  • US11119877B2 patent drawing
  • US11119877B2 patent drawing

AI summary

A system for testing electrical components comprising a supplier test system operating on a first processor and configured to generate test data for a component and to store the component test data on a block chain. A board level test system operating on a second processor and configured to generate test data for a board and to store the board test data on the block chain. A test tracking system configured to request a first key to access to the component test data and a second key to access the board test data and to store the first key and the second key.