Blue-Laser Tool Measurement Optics for Contaminant Resistance

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Solution Overview

Problem

Existing non-contact tool measurement apparatuses in machine tool environments face challenges with contamination and debris ingress due to the harsh conditions, particularly with the use of longer wavelengths of light, which affects the reliability and accuracy of tool measurements.

Innovation Solution

A non-contact tool measurement apparatus utilizing a laser that generates light with a wavelength of less than 590 nm, allowing for a smaller beam size and aperture, thereby reducing contaminant ingress and improving robustness, with a processor for analyzing detected light to enable precise tool measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a longer wavelength of light (e.g., 700 nm) is used, then the measurement capability and detection range are improved, but the aperture size must be larger which increases contaminant ingress

Engineering Contradiction:
Improvetool measurement capabilityVSAvoidcontaminant ingress
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent changes the wavelength parameter of the light source from conventional longer wavelengths (e.g., 700 nm) to shorter wavelengths (less than 590 nm). This parameter change allows the optical system to use smaller apertures while maintaining measurement capability, thereby reducing contaminant ingress in the harsh machine tool environment.

Inventive Principle:
Principle #35Parameter changes

2Use of energy by moving object

If a larger aperture is used to transmit light, then the light transmission efficiency is improved, but the ingress of contaminants through the aperture increases

Engineering Contradiction:
Improvelight transmission efficiencyVSAvoidcontaminant ingress
Core Design Contradiction:
Use of energy by moving objectVSObject-affected harmful factors

Solution Approach 1:

By changing the light wavelength parameter to shorter wavelengths (less than 590 nm), the patent enables the use of smaller apertures that maintain sufficient light transmission efficiency while significantly reducing the ingress of contaminants such as coolant and cutting debris.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If pressurized air is continuously ejected through the aperture to prevent contamination, then the protection against contaminants is improved, but the air consumption increases

Engineering Contradiction:
Improveprotection against contaminantsVSAvoidair consumption
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent changes the operating wavelength parameter to less than 590 nm, which enables smaller aperture design. This reduces the volume of pressurized air needed for contamination protection while maintaining reliability, thereby reducing air consumption.

Inventive Principle:
Principle #35Parameter changes

4Object-affected harmful factors

If smaller apertures are used to reduce contaminant ingress, then the resistance to contaminants is improved, but the light transmission capability is reduced

Engineering Contradiction:
Improveresistance to contaminantsVSAvoidlight transmission capability
Core Design Contradiction:
Object-affected harmful factorsVSUse of energy by moving object

Solution Approach 1:

By changing the light wavelength parameter to shorter wavelengths (less than 590 nm), the patent enables smaller apertures to transmit sufficient light for accurate tool measurement while providing better resistance to contaminant ingress.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances the resistance to contaminants and reduces air consumption, resulting in a more reliable and accurate tool measurement system with improved resistance to coolant and cutting debris, enabling precise tool positioning and measurement.

Implementation Method 1

a transmitter comprising a first aperture and a laser for generating light, the light generated by the laser being emitted from the transmitter through the first aperture towards a tool-sensing region

Methodology Applied
Scientific EffectLight: Light

Implementation Method 2

a receiver comprising an optical detector for detecting received light, the receiver being arranged to receive light from the tool-sensing region

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentUS11904426B2Non-contact tool measurement apparatus
Publication Date: 2024.02.20 RENISHAW PLC
  • US11904426B2 patent drawing
  • US11904426B2 patent drawing

AI summary

A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.