Board-Like Connector With Single-Arm Bridges for Solder-Free Wafer Testing
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Solution Overview
Problem
Conventional wafer testing devices are prone to damage from thermal shock due to soldering of the signal transmission board to the testing circuit board, and they are not suited for inspection and maintenance as the components are fixed together.
Innovation Solution
A wafer testing assembly that uses a board-like connector with single-arm bridges and an insulating layer, allowing the signal transmission board and testing circuit board to be electrically coupled without soldering, with the single-arm bridges elastically abutting against both boards, facilitating easy separation for maintenance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the signal transmission board is soldered to the testing circuit board, then the connection is strong and stable, but the device is easily damaged from thermal shock and not suited for inspection and maintenance
Solution Approach 1:
The patent divides the connection system into separate components: the signal transmission board, the testing circuit board, and the board-like connector with single-arm bridges. This segmentation eliminates the need for soldering between boards, allowing each component to be independently replaced or maintained without exposing the entire assembly to thermal shock from soldering processes.
Solution Approach 2:
The board-like connector acts as an intermediary component between the signal transmission board and the testing circuit board. It provides the electrical connection function without requiring direct soldering between the two boards, thereby protecting them from thermal shock while maintaining connection stability through the connector's contact structures.
2Reliability
If the signal transmission board and testing circuit board are soldered together, then the connection is strong, but the components cannot be easily separated for inspection and maintenance
Solution Approach 1:
By segmenting the connection system into separate boards and a modular connector, the patent enables easy separation for maintenance while maintaining strong connections during operation. The single-arm bridges with contact structures provide reliable electrical connection that can be easily disconnected and reconnected without damage.
Solution Approach 2:
The connection system transitions from a static soldered joint to a dynamic, reversible connection using the board-like connector. The single-arm bridges can be elastically deformed to establish or break contacts, allowing the system to adapt between connected and separated states for operation and maintenance respectively.
3Shape
If the cantilever is not coplanar with the carrier, then the structure may be more compact, but the stress distribution is poor and the cantilever is prone to breaking
Solution Approach 1:
The patent applies local quality by making the cantilever coplanar with the carrier specifically at the connection region where stress concentration would occur. This local geometric optimization ensures uniform stress distribution along the cantilever length, preventing breaking while maintaining overall structural efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution prevents damage from thermal shock and allows for easy inspection and maintenance by eliminating the need for soldering, while the coplanar cantilever design enhances manufacturing yield and reduces the risk of cantilever breakage.
Implementation Method 1
when the cantilever of any one of the single-arm bridges is bent by receiving an external force, a stress would be uniformly distributed on the cantilever, thereby effectively decreasing the breaking possibility of the cantilever from the carrier
Implementation Method 2
the abutting column and the abutting end portion of any one of the single-arm bridges elastically abut against the two boards (e.g., the signal transmission board and the testing circuit board) by being in cooperation with the cantilever
Data Source
AI summary
A board-like connector, a single-arm bridge of a board-like connector, and a wafer testing assembly are provided. The board-like connector includes a plurality of single-arm bridges spaced apart from each other and an insulating layer. Each of the single-arm bridges includes a carrier, a cantilever extending from and being coplanar with the carrier, an abutting column, and an abutting end portion, the latter two of which extend from the cantilever and are respectively arranged at two opposite sides of the cantilever. The insulating layer connects the carriers of the single-arm bridges, and the abutting column of each of the single-arm bridges protrudes from the insulating layer. The abutting column and the abutting end portion of each of the single-arm bridges are configured to abut against two boards, respectively.