Bond Pad Integrated Diode Ring for Adjustable ESD Protection

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Solution Overview

Problem

Existing protection circuits for electronic circuits face challenges in efficiently addressing electrostatic discharge (ESD) and impedance mismatches without increasing the size or cost of integrated circuits, requiring adaptable solutions for various voltage levels and types of ESD events.

Innovation Solution

A protection circuit comprising at least three diodes connected in series, formed using the InGaP HBT process and fabricated underneath bond pads via interlayer dielectric metallization, with adjustable turn-on voltages achieved by reconfigurable taps, allowing for compact integration and reduced layout area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If protection circuit is added to protect electronic circuit from ESD, then reliability is improved, but area of integrated circuit increases

Engineering Contradiction:
ImproveESD protectionVSAvoidintegrated circuit area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The protection circuit is merged with the bond pad structure by forming diodes underneath the bond pads using the same inter layer dielectric metallization technique. This integration allows the protection circuit to share the bond pad area, minimizing additional space requirements while providing effective ESD protection.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The diodes formed in the bond pad region serve dual functions: they provide ESD protection and can be configured to provide impedance mismatch protection. The selectable tap positions allow the same structure to protect against different types of ESD events (positive and negative polarity) and impedance mismatches, making the protection circuit universally applicable to various protection needs.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If different configurations of protection circuit are designed for various nodes, then adaptability is improved, but device complexity increases

Engineering Contradiction:
Improvecompatibility with different circuit nodesVSAvoidprotection circuit configuration
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The protection circuit incorporates selectable tap positions that allow dynamic configuration of the turn-on voltage by choosing different numbers of diodes in series. This dynamic adjustability enables the same basic structure to be adapted to different voltage requirements (DC versus RF, input versus output) without redesigning the entire protection circuit, thereby improving adaptability while maintaining structural simplicity.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The turn-on voltage of the protection circuit is adjusted by changing the number of diodes connected in series between the selectable taps. This parameter change allows the protection circuit to be customized for different voltage levels and ESD event magnitudes required by different circuit nodes, achieving versatility through simple parameter adjustment rather than complex structural changes.

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If protection circuit is integrated into existing process, then ease of manufacture is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improveintegration with analog compound semiconductor processVSAvoiddiode formation under bond pads
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The protection circuit utilizes the existing inter layer dielectric metallization technique already employed in the analog compound semiconductor process for bond pad formation. By self-serving the process infrastructure, the protection circuit is manufactured simultaneously with the bond pads using the same deposition and patterning steps, eliminating the need for separate protection circuit fabrication processes and reducing overall manufacturing complexity.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides effective ESD protection with adjustable turn-on voltages, reducing design and development costs while minimizing additional space and cost, enabling efficient protection across different electronic circuit configurations.

Implementation Method 1

The protection circuit protects an electronic circuit from damages caused by ESD and impedance mismatches by diverting the currents from excessive applied voltages/electric fields to an alternative path provided by the ESD protection circuit

Methodology Applied
Scientific EffectElectrostatic Discharge: Electrostatic Discharge

Implementation Method 2

The protection circuit comprises at least three diodes connected in series in such a manner that an anode terminal of a first diode is connected to a cathode terminal of a second diode to form a ring

Methodology Applied
Scientific EffectDiode: Diode

Data Source

PatentUS8767361B1Protection circuit for an electronic circuit
Publication Date: 2014.07.01 SKYWORKS SOLUTIONS INC
  • US8767361B1 patent drawing
  • US8767361B1 patent drawing
  • US8767361B1 patent drawing

AI summary

A protection circuit for an electronic circuit. The protection circuit comprises at least three diodes connected in series in such a manner that an anode terminal of a first diode is connected to a cathode terminal of a second diode to form a ring. A first terminal is connected between diodes of a first pair of consecutive diodes of the ring. A second terminal is connected between diodes of a second pair of consecutive diodes of the ring. The position of the first terminal is fixed and the position of the second terminal is selectable in such a manner that a pre-determined turn-on voltage of the at least three diodes is obtained. The diodes are formed under one or more bond pads of the electronic circuit.