Bond Pad Layout Using Mutual Inductance for Die Capacitance Compensation

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Solution Overview

Problem

Existing semiconductor dies that use on-die T-coil circuits to compensate for parasitic capacitance inevitably require a larger die area, necessitating an innovative design that can achieve equivalent negative inductance without using on-die T-coil circuits.

Innovation Solution

A semiconductor die with a peculiar bond pad arrangement that leverages mutual inductance between bond wires to realize a bond wire T-coil circuit with equivalent negative inductance, allowing for parasitic capacitance compensation without increasing the die area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If on-die T-coil circuits are used to compensate parasitic capacitance, then parasitic capacitance compensation is achieved, but die area increases

Engineering Contradiction:
Improveparasitic capacitance compensationVSAvoiddie area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The invention extracts the T-coil circuit function from the on-die implementation and relocates it to the bond wire level. By using the bond wires themselves to form the T-coil structure through specific bonding patterns, the need for dedicated on-die inductor structures is eliminated, thus achieving parasitic capacitance compensation without occupying additional die area.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The bond wires serve multiple functions: they provide electrical connection between the die and external pins, and simultaneously function as the inductive elements of the T-coil circuit. This multi-functionality eliminates the need for separate on-die inductor components, achieving compensation while maintaining compact die area.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If bond wire T-coil circuit is implemented, then parasitic capacitance is reduced, but bond pad arrangement complexity increases

Engineering Contradiction:
Improveparasitic capacitance reductionVSAvoidbond pad arrangement
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The invention merges the electrical connection function with the T-coil circuit function by having bond wires connect adjacent bond pads. This combining of functions creates the T-coil structure inherently through the bonding process itself, achieving parasitic capacitance reduction while maintaining relatively simple bond pad arrangement.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The bond wire T-coil circuit with equivalent negative inductance effectively reduces parasitic capacitance, achieving the necessary compensation without the space requirements of on-die T-coil circuits.

Implementation Method 1

leveraging mutual inductance between bond wires to realize a bond wire T-coil circuit with equivalent negative inductance

Methodology Applied
Scientific EffectMutual inductance: Electromagnetic Induction

Data Source

PatentUS12327806B2Semiconductor die with peculiar bond pad arrangement for leveraging mutual inductance between bond wires to realize bond wire T-coil circuit with equivalent negative inductance
Publication Date: 2025.06.10 AIROHA TECH (HK) LTD
  • US12327806B2 patent drawing
  • US12327806B2 patent drawing
  • US12327806B2 patent drawing

AI summary

A semiconductor die includes a processing circuit, a first bond pad, and a second bond pad. The first bond pad is electrically connected to a first node of the processing circuit and a first bond wire. The second bond pad is electrically connected to a second node of the processing circuit and a second bond wire. The first bond wire and the second bond wire are magnetically coupled to form a first bond wire T-coil circuit with equivalent negative inductance.