Bonding Pad Wire Layout to Prevent Edge Short Circuits

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Solution Overview

Problem

Conductive wires used for bonding devices or semiconductor wafers often bend and protrude, leading to undesired short circuits and reduced device reliability.

Innovation Solution

A bonding structure with a top surface featuring a center region with a higher density of wires and a peripheral region with a lower density or no wires, designed to prevent short circuits by minimizing wire protrusion.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conductive wires are used for bonding devices or semiconductor wafers, then electrical connection is achieved, but wires easily bend and protrude causing short circuits

Engineering Contradiction:
Improvedevice reliabilityVSAvoidwire bending and protrusion
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies local quality by creating different wire density zones within the bonding structure. The center region has high wire density while the peripheral region has low or zero wire density. This spatial differentiation of wire distribution prevents wires from bending and protruding at critical edge areas where short circuits would occur, while maintaining sufficient connectivity in the center region.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The bonding structure is segmented into distinct regions: a center region with high wire density and peripheral regions with low or no wires. This segmentation allows different functional zones to serve different purposes - the center provides electrical connectivity while the periphery remains clear to prevent wire protrusion and short circuits.

Inventive Principle:
Principle #1Segmentation

2Reliability

If wire density is increased to improve electrical connection, then connectivity is enhanced, but wire protrusion and short circuit risk increase

Engineering Contradiction:
Improveelectrical connectionVSAvoidshort circuit
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent implements local quality by varying wire density across different spatial zones. The center region maintains high wire density to ensure robust electrical connection, while peripheral regions have reduced or zero wire density to eliminate the harmful effect of wire protrusion and potential short circuits.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The structure is divided into functional segments: a central bonding zone with dense wire distribution for electrical connectivity and peripheral zones with sparse or absent wires to prevent short circuits. This segmentation resolves the contradiction by allowing high connectivity where needed while eliminating hazards where they would occur.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20250038078A1Bonding structure and package structure
Publication Date: 2025.01.30 ADVANCED SEMICON ENG INC
  • US20250038078A1 patent drawing
  • US20250038078A1 patent drawing
  • US20250038078A1 patent drawing

AI summary

A bonding structure and a package structure are provided. The bonding structure includes a first pad and a plurality of first wires. The first pad has a top surface including a first region and a second region, wherein the second region is closer to an edge of the top surface of the first pad than the first region is. The first wires are on the top surface of the first pad, wherein a number of the first wires on the first region is greater than a number of the first wires on the second region.