Bonding Wire Light Shielding in Semiconductor Imaging

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Solution Overview

Problem

Semiconductor apparatuses face image quality degradation due to reflected light from wirings, leading to issues like flare and ghosts, and existing solutions either require additional components or increase the size of the apparatus.

Innovation Solution

The semiconductor apparatus incorporates a bonding wire disposed along the plane of a sheet-like member to prevent reflected light from reaching the light-receiving surface, with a projecting part formed to shield the conductive bonding portion from incident light, allowing for a compact design without additional components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If a shield member is provided to block reflected light from metal wire bonding portions and metal wires, then image quality is improved, but device complexity and manufacturing cost increase

Engineering Contradiction:
Improvereflected light interferenceVSAvoidadditional components
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The harmful function of the metal wire bonding portion and metal wire (reflecting light) is extracted and separated from their original positions. The metal wire bonding portion is pressed into a recess and the metal wire is routed along the plane, removing their light-reflecting capability while preserving their electrical connection function.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The metal wire bonding portion and metal wire, which originally caused harm by reflecting light, are repositioned to serve a dual function: maintaining electrical connection while acting as light shields. The metal wire bonding portion pressed into the recess and the metal wire along the plane create shielding effects that block reflected light from reaching the light-receiving surface.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Object-affected harmful factors

If electrode pads are disposed apart from the light-receiving surface to suppress reflected light, then image quality is improved, but the size of the semiconductor apparatus increases

Engineering Contradiction:
Improvereflected light interferenceVSAvoidchip area
Core Design Contradiction:
Object-affected harmful factorsVSArea of stationary object

Solution Approach 1:

The solution moves from a two-dimensional planar arrangement to a three-dimensional configuration. The metal wire bonding portion is pressed vertically into a recess, and the metal wire is routed along the plane at a different height level, utilizing the vertical dimension to achieve light shielding without increasing the horizontal footprint of the chip.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Object-affected harmful factors

If metal wire bonding portions and metal wires are shielded from incident light, then reflected light interference is reduced, but additional manufacturing processes are required

Engineering Contradiction:
Improvereflected light interferenceVSAvoidmanufacturing process complexity
Core Design Contradiction:
Object-affected harmful factorsVSEase of manufacture

Solution Approach 1:

The wire bonding process is merged with the light shielding function. The same metal wire bonding portion and metal wire that establish electrical connections are also positioned to provide optical shielding, combining two functions into a single integrated solution rather than adding separate shielding components or processes.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively suppresses image degradation while maintaining a small-sized semiconductor apparatus, eliminating the need for additional components and reducing manufacturing costs.

Implementation Method 1

The bonding wire is disposed along the plane of the first sheet-like member in such a manner that reflected light from the bonding wire does not impinge on the light receiving surface

Methodology Applied
Scientific EffectLight blocking: Absorption (EM radiation)

Data Source

PatentUS9018728B2Semiconductor apparatus, manufacturing apparatus, and manufacturing method
Publication Date: 2015.04.28 SONY GROUP CORP
  • US9018728B2 patent drawing
  • US9018728B2 patent drawing
  • US9018728B2 patent drawing

AI summary

A semiconductor apparatus includes: a first sheet-like member having a light receiving surface of an imaging device and a first connection terminal disposed thereon, the imaging device generating an image by receiving incident light from a light collecting section for collecting external light disposed thereon; a second sheet-like member having a second connection terminal to be connected to the first connection terminal provided thereon; a conductive bonding portion made of a conductive material and bonded with the first connection terminal; and a bonding wire connecting the conductive bonding portion and the second connection terminal, wherein the bonding wire is disposed along the plane of the first sheet-like member such that reflected light from the bonding wire does not impinge on the light receiving surface.