Boost Capacitor Circuit Area Efficiency via Voltage Doubler

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Solution Overview

Problem

Conventional boost capacitor circuits in charge pumps have low area efficiency due to their inability to accumulate a sufficient charge on each unit area, limiting the generation of high voltages required for data programming and erasing in flash memory devices.

Innovation Solution

A boost capacitor circuit design incorporating a first nMOS transistor and a voltage doubler circuit with specific transistor configurations, including thick-gate-oxide nMOS and thin-gate-oxide pMOS transistors, that increases the voltage at a second node to provide a boosted voltage with expanded amplitude, enhancing area efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If conventional boost capacitor circuits operate with voltage amplitude equal to working voltage VDD, then the circuit structure is simple, but the area efficiency is low due to limited charge accumulation

Engineering Contradiction:
Improvecharge accumulationVSAvoidcapacitor area
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The patent changes the voltage amplitude parameter from VDD to 2×VDD by introducing a voltage doubler circuit. This parameter change enables the boost capacitor to accumulate twice the charge per unit area (2×C×VDD instead of C×VDD), directly resolving the contradiction between charge accumulation and capacitor area.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The voltage doubler circuit acts as an intermediary component that converts the working voltage VDD into a doubled voltage 2×VDD. This intermediary mechanism enables the boost capacitor to operate at higher voltage amplitude without requiring larger capacitor area, thus improving area efficiency.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Quantity of substance

If the voltage amplitude is increased to improve area efficiency, then charge accumulation per unit area increases, but the circuit complexity increases due to additional transistors

Engineering Contradiction:
Improvecharge accumulationVSAvoidcircuit structure
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent segments the voltage boosting function into two separate modules: the voltage doubler circuit (using pMOS transistors) and the boost capacitor circuit (using nMOS transistors). This segmentation allows each module to be optimized independently, achieving 2×VDD voltage amplitude while maintaining clear functional separation and manageable circuit complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The voltage doubler circuit serves multiple functions: it doubles the voltage amplitude, provides the boosted voltage to the boost capacitor, and enables the charge pump to achieve higher area efficiency. This multi-functionality reduces the need for additional dedicated components, thereby controlling overall circuit complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The improved design significantly increases area efficiency by allowing the accumulation of a higher charge on each unit area, effectively raising the output voltage and enhancing the charge pump's ability to generate the required high voltages for flash memory operations.

Implementation Method 1

the voltage at the second node is raised by the voltage doubler circuit so that the first nMOS transistor can provide a boosted voltage at its gate with expanded amplitude

Methodology Applied
Scientific EffectVoltage doubling:

Implementation Method 2

the first nMOS transistor having a gate for providing a boosted voltage

Methodology Applied
Scientific EffectCapacitance: Capacitance

Data Source

PatentUS9525340B1Boost capacitor circuit and charge pump
Publication Date: 2016.12.20 SHANGHAI HUAHONG GRACE SEMICON MFG CORP
  • US9525340B1 patent drawing
  • US9525340B1 patent drawing
  • US9525340B1 patent drawing

AI summary

A boost capacitor circuit is disclosed which includes a first nMOS transistor and a voltage doubler circuit including: a first pMOS transistor having a drain coupled to a working voltage, a source coupled to a first node and a gate coupled to a second node; a drive inverter having an input terminal for receiving a first signal; a second pMOS transistor having a gate coupled to an output terminal of the drive inverter, a source and a drain coupled to each other and further to the first node; a third pMOS transistor having a gate for receiving the first signal, a source coupled to the first node and a drain coupled to the second node; and a second nMOS transistor having a gate for receiving the first signal, a source coupled to a low voltage and a drain coupled to the second node.