Booster Circuit Variable Voltage Divider for Stress Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing booster circuits for non-volatile memories, such as EEPROMs, face inefficiencies in stress testing due to intermittent operation and variable voltage division, which affects the consistency and effectiveness of the boosted voltage applied during erase/write operations.
Innovation Solution
A booster circuit with a variable voltage-dividing ratio in the voltage divider circuit and a limiter circuit to clamp the boosted voltage, allowing continuous operation in test mode, ensuring a consistent and higher boosted voltage is maintained during stress testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of energy
If the booster circuit operates intermittently based on voltage comparison, then energy consumption is reduced and normal operation is maintained, but stress testing efficiency deteriorates due to inconsistent boosted voltage
Solution Approach 1:
The voltage divider circuit dynamically changes its dividing ratio based on the test mode signal. In test mode, the dividing ratio is adjusted to ensure the comparator continuously outputs a high level signal, making the booster circuit operate continuously rather than intermittently, thereby improving stress testing efficiency while maintaining acceptable energy consumption through controlled continuous operation.
2Device complexity
If the voltage divider circuit uses a fixed dividing ratio, then circuit complexity is reduced, but testing versatility deteriorates due to inability to adapt to different test requirements
Solution Approach 1:
The voltage divider circuit employs a dynamic switching mechanism that changes the resistance configuration based on the test mode signal. This allows the dividing ratio to be adjusted between different states (e.g., first dividing ratio for normal operation, second dividing ratio for test mode), providing testing versatility without significantly increasing overall circuit complexity through the use of existing switches and resistors.
Solution Approach 2:
The voltage divider circuit serves multiple functions: it provides voltage division for normal operation and adjusted voltage division for test mode operation. By integrating the test mode signal detection and switching capabilities into the existing voltage divider structure, the circuit achieves multi-functionality, supporting both normal boosting operation and stress testing requirements with a single unified circuit design.
3Stability of the object's composition
If the booster circuit stops when divided voltage exceeds reference voltage, then voltage regulation is maintained, but test consistency deteriorates due to intermittent operation during stress testing
Solution Approach 1:
The circuit implements different operational characteristics for different modes: in normal operation mode, the booster stops when divided voltage exceeds reference voltage to maintain voltage regulation; in test mode, the voltage divider ratio is adjusted so the comparator continuously outputs high level, making the booster operate continuously for test consistency. Each mode has optimized local characteristics suited to its purpose.
Solution Approach 2:
The system dynamically switches between two operational states based on the test mode signal. The voltage divider ratio is dynamically adjusted, and the booster operation mode (intermittent vs. continuous) is dynamically changed accordingly. This dynamic adaptation allows the circuit to maintain voltage regulation during normal operation while ensuring test consistency during stress testing.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances the efficiency of stress testing by maintaining a higher boosted voltage consistently, improving the reliability and effectiveness of the testing process for circuits subjected to boosted voltages.
Implementation Method 1
a voltage divider circuit configured to divide the boosted voltage, thereby outputting a divided voltage
Implementation Method 2
a comparator circuit configured to compare the divided voltage and a reference voltage to each other, thereby outputting a result of the comparison as the signal
Implementation Method 3
a booster section configured to boost the input voltage when the booster section receives a pulse signal from the oscillator circuit
Data Source
AI summary
Provided is a booster circuit enabling improvement of efficiency of a stress test for a circuit to which a boosted voltage is applied. A voltage divider circuit is configured to have a voltage-dividing ratio that is variable depending on a test signal, and a limiter circuit is configured to clamp a voltage to a voltage higher than a boosted voltage in normal operation. In a test mode, the voltage divider circuit is controlled so that the boosted voltage becomes higher than that in the normal operation, and the limiter circuit clamps the boosted voltage, with the result that a booster section continuously operates.