Boot-Up Read Patterning for Faster Memory Power-Up Reads

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Solution Overview

Problem

Memory devices experience high error rates during power up due to transitions from transient to stable states, leading to costly and time-consuming read error handling operations, which can result in host system timeouts.

Innovation Solution

Implementing a boot-up read pattern data structure that proactively performs a dummy read using a pattern likely to be used during power up, transitioning memory cells from stable to transient states to reduce error rates.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If read error handling operations are performed during power up to ensure data accuracy, then reliability is improved, but time consumption increases causing host system timeouts

Engineering Contradiction:
Improvedata accuracyVSAvoidpower up time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent performs a preliminary dummy read operation during power up using a specific read pattern before normal read operations. This preliminary action transitions memory cells from stable state to transient state in advance, ensuring that subsequent reads during the critical power up period will have lower error rates, thereby reducing the need for error handling retries and decreasing overall power up time.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If dummy read operations are performed to transition memory cells to transient states, then error rates are reduced, but additional operations increase time consumption

Engineering Contradiction:
Improveerror rateVSAvoidoperation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent changes the read pattern parameter during power up to a specific dummy read pattern that is optimized for transitioning memory cells from stable to transient states. By modifying this operational parameter, the system achieves faster state transition and reduced error rates without requiring excessive additional time, as the dummy read pattern is designed to be executed efficiently.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If read error handling operations are performed to ensure data integrity, then data integrity is improved, but productivity decreases due to repeated operations

Engineering Contradiction:
Improvedata integrityVSAvoidread operation efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent executes a preliminary dummy read operation during power up that proactively transitions memory cells to the transient state, preventing read errors before they occur. This preliminary action eliminates the need for subsequent error handling operations and retries, thereby maintaining data integrity while significantly improving read operation efficiency during the critical power up period.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20260038622A1Reducing read error handling operations during power up of a memory device
Publication Date: 2026.02.05 MICRON TECHNOLOGY INC
  • US20260038622A1 patent drawing
  • US20260038622A1 patent drawing
  • US20260038622A1 patent drawing

AI summary

A boot-up read pattern data structure is maintained. Each entry of the boot-up read pattern data structure comprises a boot-up read pattern associated with a respective power cycle event and a dummy boot-up read pattern flag. The dummy boot-up read pattern flag indicates that the boot-up read pattern has been consecutively used during boot-up. Storing, in a new entry of the boot-up read pattern data structure, a current boot-up read pattern associated with a respective power cycle event for each power cycle event. The current boot-up read pattern with a previous boot-up read pattern associated with a latest entry of the boot-up pattern data structure is compared. A dummy boot-up read pattern flag of the new entry is updated responsive to the comparing the current boot-up read pattern and the previous boot-up read pattern.