Bottleneck Device Extraction Using Production Fluctuation Analysis

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Solution Overview

Problem

Existing methods fail to accurately identify bottleneck devices in production systems due to the mutual influence of production fluctuations across processes, leading to inefficiencies and reduced productivity in high-tech manufacturing, such as semiconductor and electronic device production.

Innovation Solution

A bottleneck device extraction system that collects and analyzes production indexes, calculates moving averages and dispersion, and uses a variation coefficient to visualize production fluctuations over time, identifying the most upstream process with the longest propagation length as the bottleneck device.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If production fluctuation analysis is performed without considering mutual influence among processes, then analysis complexity is reduced, but bottleneck device identification accuracy deteriorates

Engineering Contradiction:
Improveanalysis complexityVSAvoidbottleneck device identification accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent segments the production system into individual processes and devices, assigning unique identifiers to each. By dividing the complex mutual influence analysis into discrete process segments that can be independently tracked and analyzed, the system manages complexity while maintaining accurate bottleneck identification through systematic process-by-process evaluation of production fluctuations.

Inventive Principle:
Principle #1Segmentation

2Ease of operation

If traditional bottleneck identification methods are used, then implementation simplicity is maintained, but productivity improvement effectiveness deteriorates due to inaccurate bottleneck specification

Engineering Contradiction:
Improveimplementation simplicityVSAvoidproductivity improvement effectiveness
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The patent implements feedback mechanisms by continuously monitoring production quantities, calculating production fluctuations, and using these fluctuations to identify bottleneck devices. The system feeds back the identified bottleneck information to guide productivity improvement activities, creating a closed-loop system that maintains implementation simplicity while significantly improving productivity effectiveness through accurate bottleneck specification.

Inventive Principle:
Principle #23Feedback

3Quantity of substance

If production fluctuation is not analyzed across multiple processes, then data processing volume is reduced, but bottleneck device detection accuracy deteriorates

Engineering Contradiction:
Improvedata processing volumeVSAvoidbottleneck device detection accuracy
Core Design Contradiction:
Quantity of substanceVSMeasurement precision

Solution Approach 1:

The patent extends the analysis from single-process to multi-process dimensions by examining production fluctuations across multiple consecutive processes. This dimensional expansion allows the system to trace how production variations propagate through the manufacturing chain, enabling accurate bottleneck identification while systematically managing the increased data processing requirements through structured multi-dimensional analysis.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS8423168B2Bottleneck device extracting method and bottleneck device extracting assistance device
Publication Date: 2013.04.16 HITACHI LTD
  • US8423168B2 patent drawing
  • US8423168B2 patent drawing
  • US8423168B2 patent drawing

AI summary

A method and system of specifying a device that is the root cause of impeding productivity of a production line in consideration of even mutual influence among processes of production fluctuation with respect to the subject of specifying a device in which productive capacity is reduced due to a problem that the productive capacity of the device is changed due to production that one machine works for multiple process and a problem that the productive capacity of device is changed due to high product mix and low product volume production. A measure for changing productive capacity of devices intentionally and simulating influence to the whole production system, a measure for measuring mutual influence among processes of production fluctuation produced by the simulation and a measure for specifying a device that is the root cause of impeding the productivity on the basis of the measured result are provided.