Boundary Test Circuit Phase Switching Toggle Circuits
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Solution Overview
Problem
Conventional boundary test circuits have low efficiency and poor flexibility due to the need for sequential transmission of test data and the inability to efficiently control phase switching of test signals, which is inadequate for modern, densely packed integrated circuits.
Innovation Solution
A boundary test circuit comprising serially-connected wrapper boundary registers (WBRs) and toggle circuits (TCs), where each TC controls the phase switching of the real-time test signal, allowing for either identical or inverse phases to be transmitted to the integrated circuit, enhancing test efficiency and flexibility.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If sequential transmission of test data is used in conventional boundary test circuits, then device complexity is reduced, but productivity deteriorates due to low test efficiency
Solution Approach 1:
The patent applies dynamics by making the test circuit configurable between different operational modes. The boundary test circuit can dynamically switch between sequential transmission mode and parallel transmission mode based on test requirements, allowing it to adapt its behavior rather than being fixed in a single mode of operation.
Solution Approach 2:
The patent implements multi-functionality by designing a boundary test circuit that can perform multiple functions: it can operate in both sequential transmission mode and parallel transmission mode, and can function as both a test controller and a data transmitter. This universal design allows the same circuit to handle different test scenarios without requiring separate dedicated circuits for each function.
2Adaptability or versatility
If conventional boundary test circuits are used without phase switching capability, then device complexity is minimized, but adaptability deteriorates due to poor flexibility
Solution Approach 1:
The patent applies dynamics by implementing phase switching capability that allows the test circuit to dynamically change its output signal phase. The circuit can switch between different phase states (e.g., 0度和180度相位) based on test requirements, making the test process more flexible and adaptable to different testing scenarios.
Solution Approach 2:
The patent implements parameter changes by modifying the phase parameter of the test signal. By changing the phase parameter of the output signal, the circuit can adapt to different test requirements without changing its fundamental structure, thereby improving flexibility while controlling complexity.
3Measurement precision
If different test vectors are input to all BSCs before output, then measurement precision is improved, but loss of time increases due to sequential processing
Solution Approach 1:
The patent applies preliminary action by pre-loading test data into the boundary scan cells before the actual test operation. The test data is prepared and stored in advance in the BSCs, allowing the test to proceed efficiently without requiring sequential input of different test vectors during the test execution phase.
Solution Approach 2:
The patent implements continuity of useful action by enabling parallel transmission of test data through multiple BSCs simultaneously. Instead of sequentially processing each BSC, the circuit maintains continuous useful action by allowing multiple data transmissions to occur in parallel, significantly reducing the total test time while maintaining test accuracy.
Data Source
AI summary
Boundary test circuit, memory and boundary test method are provided. The boundary test circuit may include a plurality of serially-connected wrapper boundary registers (WBRs) and a plurality of toggle circuits (TCs). Each WBR may include a first I/O for receiving an initial test signal and a second I/O for transmitting the initial test signal to the WBR at a succeeding stage. Each TC may include an input for receiving the initial test signal stored in a corresponding WBR, a control I/O for receiving a toggle signal, and an output for transmitting a real-time test signal to the integrated circuit. The toggle signal may be configured to control phase switching of the real-time test signal, and, depending on the toggle signal, the real-time test signal may have a phase identical or inverse to a phase of the initial test signal. This method improves the efficiency and flexibility of the boundary test.