Bounded Fault Compliant Metadata Storage Architecture

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Solution Overview

Problem

Existing memory architectures struggle to ensure that metadata remains bounded fault compliant, preventing errors from propagating across multiple data terminals, which can exceed the correction capabilities of error correction mechanisms.

Innovation Solution

Implementing a memory module architecture where metadata is sent and received along only one of the DQ terminals, using 9×2p2 or 5×2p4 configurations, ensuring that errors in metadata are confined to a single DQ terminal and can be corrected by the error correction device.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If metadata is transmitted across multiple DQ terminals, then data throughput is improved, but error propagation risk increases beyond correction capabilities

Engineering Contradiction:
Improvedata throughputVSAvoiderror correction capability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent segments metadata transmission by confining it to a single DQ terminal rather than distributing across multiple terminals. This segmentation isolates potential errors to one terminal, ensuring that error propagation remains within the correction capability of the error correction device while maintaining system reliability.

Inventive Principle:
Principle #1Segmentation

2Quantity of substance

If metadata is stored in the memory array, then storage efficiency is improved, but bounded fault compliance becomes difficult to ensure

Engineering Contradiction:
Improvestorage efficiencyVSAvoidbounded fault compliance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent applies local quality by storing metadata in a specific, dedicated location within the memory array rather than distributing it throughout. This localized storage approach ensures that metadata errors remain confined to a specific region, making it easier to maintain bounded fault compliance while improving overall storage efficiency.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS20250110643A1Apparatuses and methods for bounded fault compliant metadata storage
Publication Date: 2025.04.03 MICRON TECHNOLOGY INC
  • US20250110643A1 patent drawing
  • US20250110643A1 patent drawing
  • US20250110643A1 patent drawing

AI summary

Apparatuses, systems, and methods for bounded fault compliant metadata storage. A memory module may be capable of repairing information along a portion of the data terminals of a memory device. To prevent errors in the metadata from propagating across more than the correctable portion, the metadata may be provided along a portion of the data terminals, while the data associated with that metadata is provided along more data terminals. For example, in a 9×2p2 module the data may use two terminals, while the metadata only uses one. In a 5×2p4 module, the metadata may use a pair of terminals, while the data uses four.