Brightness Correction via Overlapping Image Tiles
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Solution Overview
Problem
Existing imaging methods, particularly in microscopy, face challenges in correcting system-related imaging aberrations and brightness differences, which can lead to errors when stitching image tiles together.
Innovation Solution
A method and apparatus for producing a corrected image by capturing a plurality of image tiles with overlapping regions, where the size of the correction image overlap region is greater than the minimum size of the image tile overlap region, allowing for the creation of a high-quality brightness correction image.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a standard overlap region size is used for capturing image tiles, then the stitching process can be completed, but the brightness correction image quality is insufficient due to limited overlap data
Solution Approach 1:
The patent applies partial action by capturing image tiles with an overlap region that exceeds the minimum required size. Specifically, the overlap region is set to be larger than necessary for basic stitching, providing additional pixels that can be used to calculate more accurate mean brightness values. This excessive overlap captures more data from the same field of view, improving correction quality without requiring additional illumination time or moving the illumination device.
2Measurement precision
If multiple image tiles are captured to improve brightness correction, then the correction accuracy increases, but the complexity of the stitching process increases
Solution Approach 1:
The patent segments the overall image into multiple overlapping image tiles, where each tile contains redundant overlap regions. This segmentation allows the brightness correction to be calculated independently for each tile using only its overlap pixels, simplifying the overall process. The segmentation creates natural boundaries that make it easier to manage and process individual tiles without handling the entire large-scale image at once.
3Measurement precision
If the illumination device is moved to capture reference images, then the correction can be performed, but the illumination time increases causing potential sample damage
Solution Approach 1:
The patent performs preliminary action by capturing all necessary image data during the normal sample imaging process. The overlap regions in the captured image tiles contain the information needed for brightness correction, eliminating the need for separate reference image capture. This preliminary capture of correction data during routine imaging prevents additional illumination exposure that would otherwise be required.
4Measurement precision
If a larger overlap region is used for brightness correction, then the correction quality improves, but the data processing complexity increases
Solution Approach 1:
The patent applies local quality by calculating brightness correction values locally within each overlap region of individual image tiles. Instead of processing the entire image globally, the correction is computed tile-by-tile using only the local overlap pixels. This local approach reduces data processing complexity while maintaining high correction quality, as each calculation involves only a small subset of pixels rather than the whole image dataset.
Data Source
AI summary
Corrected images are produced with an apparatus that includes a detector and a control unit. In a first operating mode, a plurality of image tiles of an object are captured as a plurality of image pixels. The control unit generates commands to capture each image, such that it partially overlaps with at least one other image tile in an image tile overlap region having a minimum size. Each captured image tile and/or a resultant image is combined pixel-wise by calculation in a brightness correction image. In a second operating mode, the brightness correction image is produced by capturing a plurality of correction image tiles of the object as a plurality of image pixels, and control commands are generated, so the object is moved relative to a detection beam path and a size of a correction image overlap region is greater than the minimum size of the image tile overlap region.


