Broadband 3D Profiling With Time-Delayed Interferometry in Liquid Samples
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Solution Overview
Problem
Conventional interferometers struggle to measure the optical path difference between a sample and a reference arm when analyzing biological samples immersed in liquid, and techniques like scanning electron microscopy are time-consuming and destructive.
Innovation Solution
A non-invasive, non-contact method using a broadband radiation source and a time-delayed interferometric system with a moving and stationary reflector to reconstruct a three-dimensional profile of translucent samples, eliminating vibration and motion, and employing tomographic imaging to capture images at different depths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional interferometers are used to measure optical path difference, then measurement capability is provided, but the system cannot effectively measure samples immersed in liquid or multilayer samples
Solution Approach 1:
The invention divides the measurement process into multiple temporal snapshots using a time-delayed reference arm, allowing the system to capture interference patterns at different time points. This segmentation enables the system to handle complex samples in liquid by measuring each layer's contribution separately in time, resolving the contradiction between versatility and reliability.
2Stability of the object's composition
If time-delayed light is used in the source arm, then vibration and motion are eliminated, but device complexity increases
Solution Approach 1:
The invention introduces a time-varying time delay in the reference arm, transforming the static interferometer into a dynamic system. By continuously varying the time delay and capturing multiple snapshots, the system achieves vibration immunity without requiring complex mechanical stabilization, resolving the contradiction between stability and device complexity.
3Measurement precision
If scanning electron microscopy is used for three-dimensional imaging, then detailed morphology is obtained, but sample preparation is time-consuming and expensive
Solution Approach 1:
The invention replaces the mechanical sample preparation and vacuum environment of electron microscopy with an optical interferometric system that works in ambient conditions. By using optical interference to measure surface topology, the system achieves three-dimensional imaging precision without time-consuming preparation steps, resolving the contradiction between measurement precision and time loss.
4Illumination intensity
If cell staining is used for imaging, then sample visibility is improved, but the sample is killed and real-time observation is impossible
Solution Approach 1:
The invention uses optical interference to create contrast based on surface topology and optical path differences rather than chemical staining. The interference fringes provide intrinsic contrast that highlights sample features without requiring exogenous dyes or stains, thus maintaining sample viability and enabling real-time observation while achieving good visibility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables non-destructive, real-time imaging of biological samples with minimal preparation, providing accurate three-dimensional morphology and cell activity observation, suitable for applications in pathology, cancer detection, and semiconductor inspection.
Implementation Method 1
Interferometers use the principles behind interference, in which light or other electromagnetic waves are superimposed with one another; the resulting interference is analyzed to extract sample properties
Implementation Method 2
The system uses a time-delayed light in the source arm to eliminate vibration and motion effects
Implementation Method 3
A detector receives an interference signal from reflected or scattered optical sample radiation and reflected or scattered optical reference radiation
Data Source
AI summary
A three-dimensional profiler includes a broadband radiation source. An interferometric system receives the radiation and includes first and second beam splitters, a moving time delay-inducing reflector, and a stationary reflector. The interferometric system creates a time-delayed optical sample radiation source and an optical reference incident radiation source with the first beam splitter. A stationary sample holder receives the optical sample incident radiation. A reference plane receives the optical reference incident radiation. A detector receives an interference signal from reflected or scattered optical sample radiation and reflected or scattered optical reference radiation. A processor extracts an optical path difference between the reference plane and the sample and reconstructs a three-dimensional morphology of the sample.