System and method for characterization of patterns marked on a fabric
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Solution Overview
Problem
Existing methods for characterizing patterns on fabrics, such as denim, are limited by the use of monochromatic sources and lack an objective measuring system for quantitative characterization, especially when dealing with broadband spectrum illumination.
Innovation Solution
A system utilizing a broadband light source with a parabolic mirror and optical device to direct and collect scattered light, combined with a wavelength division unit and computing device to analyze electrical signals and compute quality measures of patterns on fabrics, including denim, using algorithms for visibility and contrast analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If monochromatic light sources are used for fabric characterization, then the measurement system can be simpler, but the ability to analyze patterns across different wavelengths is limited
Solution Approach 1:
The patent employs a broadband light source that emits across multiple wavelengths simultaneously, allowing the measurement system to characterize fabric patterns at different wavelengths without requiring separate monochromatic sources for each wavelength. This multi-functional approach enables comprehensive spectral analysis while maintaining system simplicity.
Solution Approach 2:
The patent uses a spectrometer to divide the broadband light into distinct wavelength components, allowing separate analysis of each wavelength band. This segmentation enables the system to process different wavelength information independently while using a single integrated measurement system.
2Device complexity
If subjective visual inspection is used for pattern characterization, then the equipment is simpler, but quantitative measurement capability is lacking
Solution Approach 1:
The patent replaces subjective human visual inspection with an automated optical measurement system comprising a broadband light source, spectrometer, and computer. This substitution eliminates human subjectivity and enables precise quantitative characterization of fabric patterns through spectral analysis.
Solution Approach 2:
The system captures spectral information from the fabric, processes it through algorithms to extract quantitative pattern characteristics, and provides objective measurement results. This feedback loop enables automated, repeatable quantitative assessment rather than subjective visual evaluation.
3Loss of information
If broadband light source is used for illumination, then the spectral information available for analysis is improved, but the system complexity and cost increase
Solution Approach 1:
The patent introduces a spectrometer as an intermediary device that processes the broadband light after it interacts with the fabric. This intermediary component separates and analyzes the spectral information, making it possible to extract comprehensive wavelength-dependent pattern characteristics while using a relatively simple broadband light source.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and accurate quantitative characterization of patterns on fabrics, including denim, by analyzing electrical voltage signals from scattered light, providing quality measures like brightness contrast and visibility curves, and optimizing laser marking parameters for improved pattern visibility.
Implementation Method 1
a light source configured to generate a light beam, having a broadband spectrum (i.e. the light beam is composed by a large number of radiation components of different wavelengths that are emitted simultaneously by the light source)
Implementation Method 2
an optical arrangement configured to direct said light beam towards the fabric and to collect scattered light of said fabric upon said impingement
Implementation Method 3
The wavelength division unit is configured to separate the scattered light component into a plurality of spectral bands or colors
Implementation Method 4
The wavelength division unit is configured to separate the scattered light component into a plurality of spectral bands or colors, providing a plurality of signals of different wavelengths
Implementation Method 5
The light detection unit is configured to detect the cited plurality of signals of different wavelengths and to convert them into electrical voltage signals
Data Source
AI summary
A system and method for characterization of patterns marked on a fabric. The system includes a light source generating a light beam to impinge on a fabric; an optical arrangement including a parabolic mirror with a hole and an optical device, directing said light beam towards the fabric; a wavelength division unit; a light detection unit; and a computing device. The optical device changes and orients the direction of the light beam towards the fabric providing a scan of an area of the fabric, line-by-line, and redirects scattered light towards the light detection unit. The wavelength division unit separates the scattered light into spectral bands or colors and the computing device characterizes a pattern marked on the fabric by executing an algorithm that analyzes electrical voltage signals and that computes a quality measure of said marked pattern.