Broadband Wave Splitting for Internal Interface Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current imaging and measuring technologies for the surface of objects are well-developed but lack high-accuracy, non-destructive methods for measuring internal interfaces, especially at the nanometer scale, which is essential for preserving completeness in objects like biological tissues and industrial materials.
Innovation Solution
An imaging and measuring apparatus utilizing a broadband wave source, wave-splitting structure, wave-delaying device, reflecting component, and sensor to generate and split incident waves for non-destructive imaging and measurement of both surface and internal interfaces, improving accuracy with a calibration beam.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If destructive methods are used to measure internal interface, then measurement capability is achieved, but object completeness is destroyed
Solution Approach 1:
The patent replaces mechanical/physical destructive cutting methods with optical measurement technology. A broadband light source emits light that passes through the object, and interferometric detection measures the internal interface morphology without physical contact or damage, achieving nanometer-scale precision while preserving object integrity.
Solution Approach 2:
The patent introduces light as an intermediary substance to measure internal interfaces. The broadband light source generates light waves that penetrate the object, interact with internal interfaces, and carry measurement information back to detectors, enabling non-destructive measurement of previously inaccessible internal structures.
2Object-affected harmful factors
If ultrasonic imaging or optical coherence tomography is used, then non-destructive measurement is achieved, but nanometer-scale accuracy is not reached
Solution Approach 1:
The patent changes the wavelength parameter of the measurement probe from ultrasonic frequencies or narrowband optical wavelengths to broadband light wavelengths. This parameter change enables both deep penetration for non-destructive measurement and high spatial resolution for nanometer-scale accuracy through interferometric detection methods.
Solution Approach 2:
The patent employs periodic modulation of the broadband light source and uses interferometric detection with periodic scanning of optical path differences. This periodic action enables precise measurement of internal interface positions by detecting interference fringes, achieving nanometer-scale resolution while maintaining non-destructive measurement.
3Productivity
If broadband incident wave is used, then non-destructive imaging speed and convenience are improved, but system complexity increases
Solution Approach 1:
The patent segments the broadband light into multiple wavelength components using a diffraction grating, allowing parallel measurement at different wavelengths. This segmentation enables rapid acquisition of spectral information for comprehensive internal interface imaging, improving imaging speed and convenience despite the added optical components.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-accuracy, non-destructive imaging and measurement of both surface and internal interfaces of objects, enhancing convenience and speed while maintaining object integrity, applicable to various materials and environments.
Implementation Method 1
a broadband wave source for transmitting a broadband incident wave
Implementation Method 2
a wave-splitting structure for splitting the broadband incident wave into a first incident beam, a second incident beam, and a third incident beam
Implementation Method 3
The first incident beam impinges on an object under test, which reflects a measuring beam
Implementation Method 4
The wave-delaying device receives the second incident beam and reflects a reference beam
Implementation Method 5
The sensor receives a first interference signal of the measuring beam and the reference beam
Data Source
AI summary
The present invention provides an imaging and measuring apparatus for the surface and the internal interface of an object, which comprises a broadband wave source, a wave-splitting structure, a wave-delaying device, a reflecting component, and a sensor. The broadband wave source transmits a broadband incident wave. The wave-splitting structure splits the broadband incident wave into a first incident beam, a second incident beam, and a third incident beam. The first incident beam is illuminated on an object under test, which reflects a measuring beam. The wave-delaying device receives the second incident beam and reflects a reference beam. The reflecting component receives the third incident beam and reflects a calibration beam. The sensor receives a first interference signal of the measuring beam and the reference beam, and a second interference signal of the reference beam and the calibration beam. By means of the broadband incident wave, the morphologies of the surface and the internal interface of the object can be imaged and measured in a non-destructive way. In addition, by means of the calibration beam, the accuracy of imaging and measuring the surface and the internal interface of the object can be improved.