Bromine Etching Liquid for Gallium Oxide Control

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Solution Overview

Problem

Gallium oxide is difficult to etch using existing methods, particularly with etching liquids like hydrogen fluoride or mist etching, which are insufficient for achieving nano-level control necessary in semiconductor device manufacturing.

Innovation Solution

A method involving an etching liquid containing bromine, specifically hydrobromic acid, is used at temperatures higher than 200°C, with atomized droplets to effectively etch gallium oxide and aluminum-containing materials, allowing for precise control and surface modification.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional etching liquids (hydrogen fluoride) or mist etching are used, then etching process can be performed, but etching of gallium oxide is insufficient and nano-level control is difficult to achieve

Engineering Contradiction:
Improveetching control precisionVSAvoidetching effectiveness
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent changes the chemical composition parameter of the etching liquid from conventional hydrogen fluoride or generic mist to a specific composition containing bromine (4-40 wt%), and changes the temperature parameter to 200°C or higher. This combination of parameter changes enables effective etching of gallium oxide while achieving nano-level control precision required for semiconductor manufacturing.

Inventive Principle:
Principle #35Parameter changes

2Ease of operation

If etching liquid is sprayed as micro-mist with small particle size, then coating gaps can be addressed, but etching amount is insufficient for gallium oxide

Engineering Contradiction:
Improvecoating gap coverageVSAvoidetching amount
Core Design Contradiction:
Ease of operationVSQuantity of substance

Solution Approach 1:

The patent modifies the chemical composition parameter by incorporating bromine (4-40 wt%) in the etching liquid, which dramatically increases the etching capability on gallium oxide. This compositional change enables sufficient etching amount to be achieved while maintaining the mist spray method for good gap coverage.

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If existing etching methods are used on gallium oxide, then process can be performed, but scratch-like defects occur and surface smoothness is poor

Engineering Contradiction:
Improveprocess feasibilityVSAvoidsurface smoothness
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent changes the chemical composition to include bromine (4-40 wt%) and sets the temperature to 200°C or higher, which modifies the etching mechanism to produce cleaner removal of gallium oxide without creating scratch-like defects. This results in improved surface smoothness while maintaining process feasibility.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables efficient etching of gallium oxide with reduced scratch-like defects and improved surface smoothness, capable of forming trenches and achieving significant etching depths, suitable for semiconductor device manufacturing.

Implementation Method 1

etching an object comprising at least gallium and/or aluminum with an etching liquid comprising bromine

Methodology Applied
Scientific EffectChemical reaction: Chemical Bonding

Data Source

PatentUS11515172B2Method of etching object
Publication Date: 2022.11.29 FLOSFIA
  • US11515172B2 patent drawing
  • US11515172B2 patent drawing
  • US11515172B2 patent drawing

AI summary

In a first aspect of a present inventive subject matter, a method of etching an object to be etched with an etching liquid that contains bromine, and the object contains at least gallium and/or aluminum.