Brush Polymer Self-Aligned Patterning for Semiconductor Devices

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current photolithography methods face challenges in forming fine and minute patterns due to resolution limits, leading to the complexity and cost of double patterning techniques.

Innovation Solution

The method involves forming a brush layer on a substrate using brush polymers with hydrophobic and hydrophilic units, followed by a self-aligned layer using block copolymers, which are thermally cured to create aligned blocks that can be transferred to the object layer, enabling the formation of precise patterns without the need for multiple masks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If photolithography with exposure device is used to form fine patterns, then pattern formation capability is improved, but resolution limit prevents formation of patterns below specific critical dimension

Engineering Contradiction:
Improvepattern formation precisionVSAvoidresolution limit
Core Design Contradiction:
Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The patent divides the pattern formation process into multiple stages using guide patterns and self-aligned layers. The block copolymer system segments into distinct domains (first blocks and second blocks) that automatically align around guide patterns, enabling sub-resolution patterning without direct exposure of the final pattern geometry.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Guide patterns serve as intermediary structures that mediate between the exposure device and the final pattern. The brush layer and self-aligned layer act as intermediate materials that transfer and refine the pattern information, allowing formation of finer features than the exposure resolution would normally permit.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If double patterning method is used to overcome resolution limit, then fine patterns can be formed, but process complexity and manufacturing cost increase

Engineering Contradiction:
Improvefine pattern formationVSAvoidpatterning process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent combines multiple functions into a single self-aligned layer formation step. The block copolymer system simultaneously performs pattern multiplication, self-alignment, and domain separation in one process, eliminating the need for separate mask alignment and multiple exposure steps required by traditional double patterning.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The block copolymer system performs self-alignment and self-organization around the guide patterns without requiring external alignment machinery or complex process control. The thermodynamic drive for micelle formation and phase separation automatically positions the first blocks around guide patterns and arranges second blocks in between, creating fine patterns through self-organized behavior.

Inventive Principle:
Principle #25Self-service

3Manufacturing precision

If double patterning method is used to achieve fine patterns, then resolution is improved, but manufacturing cost increases

Engineering Contradiction:
Improvepattern resolutionVSAvoidmanufacturing cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The guide patterns serve as disposable sacrificial structures that are eventually removed after transferring the pattern information to the self-aligned layer. This allows use of simpler, lower-cost exposure processes for forming the guide patterns, while the expensive fine pattern formation occurs through the self-organizing block copolymer system rather than through expensive multi-step lithography.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for the formation of fine patterns with high reliability and precision, reducing the complexity and cost associated with traditional double patterning methods while maintaining mechanical and chemical stability.

Implementation Method 1

the brush polymer including at least one of a first brush polymer or a second brush polymer, the first brush polymer including a hydrophobic repeating unit and a hydrophilic terminal group having at least two hydroxyl groups

Methodology Applied
Scientific EffectHydrophobic and hydrophilic interactions: Hydrophobe

Implementation Method 2

forming a self-aligned layer using a block copolymer on the brush layer to form blocks aligned around the guide patterns

Methodology Applied
Scientific EffectSelf-assembly: Self-Assembly

Implementation Method 3

the first polymer unit being assembled into first blocks arranged in a grid shape or a honeycomb shape around the guide patterns, the second polymer unit being assembled into second blocks contacting the brush layer

Methodology Applied
Scientific EffectPhase separation: Phase Change

Implementation Method 4

the hydrophilic terminal group having at least two hydroxyl groups

Methodology Applied
Scientific EffectHydrogen bonding: Chemical Bonding

Data Source

PatentUS10101660B2Methods of forming patterns of semiconductor devices
Publication Date: 2018.10.16 SAMSUNG ELECTRONICS CO LTD
  • US10101660B2 patent drawing
  • US10101660B2 patent drawing
  • US10101660B2 patent drawing

AI summary

In a method of forming patterns, an object layer is formed on a substrate. Guide patterns are formed on the object layer. A brush layer is formed using a brush polymer on surfaces of the guide patterns. The brush polymer includes at least one of a first brush polymer and a second brush polymer. The first brush polymer includes a hydrophobic repeating unit and a hydrophilic terminal group having at least two hydroxyl groups. The second brush polymer includes a hydrophobic repeating unit and a hydrophilic random repeating unit having a hydroxyl group. A self-aligned layer is formed using a block copolymer on the brush layer to form blocks aligned around the guide patterns. At least a portion of the blocks is transferred to the object layer.