Low Stress Cavity Package for Back Side Illuminated Image Sensors
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Solution Overview
Problem
The packaging and assembly of back side illuminated (BSI) image sensors pose challenges due to the need for thicker micro-lenses and the difficulty in forming electrical interconnects across the chip, which affects quantum efficiency and mechanical stress, especially as the industry transitions from front side illuminated (FSI) sensors.
Innovation Solution
A novel wafer level, low stress packaging method for BSI image sensors involves attaching the image sensor chip to a crystalline handler, forming a cavity, using a compliant dielectric material, and creating electrical interconnects with slanted holes and conductive metallization to reduce mechanical stress and improve insulation, allowing for efficient signal transfer without obstructing light paths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If BSI image sensor packaging is performed using conventional COB or Shellcase WLCSP processes, then the packaging can be completed, but substantial challenges arise due to the opposite side disposition of contact pads and imaging areas
Solution Approach 1:
The patent inverts the conventional packaging approach by attaching the back surface (imaging area) of the BSI sensor chip to the carrier substrate, rather than the front surface with contact pads. This inversion allows the contact pads to be accessed from the front surface while the imaging area is properly positioned for light entry from the back, resolving the fundamental packaging challenge of BSI sensors.
Solution Approach 2:
The patent utilizes the third dimension by creating a cavity structure in the carrier substrate that accommodates the chip thickness. This vertical dimension allows for proper positioning of the chip with its back surface attached to the carrier, enabling both contact pad access and imaging area exposure without compromising either function.
2Length of moving object
If micro-lenses are made thicker to achieve shorter focal lengths in BSI sensors, then focusing in shorter distances is achieved, but the packaging and assembly become more challenging
Solution Approach 1:
The patent segments the optical path by separating the micro-lens function from the chip structure itself. The micro-lenses are formed as distinct elements on the carrier substrate or as separate components, allowing their thickness to be optimized for short focal length while the chip packaging structure remains manageable and compatible with modified conventional processes.
3Reliability
If electrical interconnects are formed across the chip in BSI sensors, then electrical connection is achieved, but mechanical stress and risk of damage increase
Solution Approach 1:
The patent introduces the carrier substrate as an intermediary structure that provides mechanical support and stress distribution. The electrical interconnects are formed through this intermediary carrier rather than directly across the fragile chip, reducing mechanical stress on the chip while maintaining reliable electrical connections to the contact pads.
4Productivity
If conventional packaging methods are used for BSI sensors, then the process can be completed, but corner stresses may cause damage
Solution Approach 1:
The patent incorporates stress relief features and compliant structures in the carrier substrate design before the chip is attached. These pre-designed cushioning elements accommodate thermal expansion differences and mechanical stresses, particularly at corner regions, preventing damage during packaging and operation while maintaining packaging completion.
Data Source
AI summary
An image sensor package includes an image sensor chip and crystalline handler. The image sensor chip includes a substrate, and a plurality of photo detectors and contact pads at the front surface of the substrate. The crystalline handler includes opposing first and second surfaces, and a cavity formed into the first surface. A compliant dielectric material is disposed in the cavity. The image sensor front surface is attached to the crystalline substrate handler second surface. A plurality of electrical interconnects each include a hole aligned with one of the contact pads, with a first portion extending from the second surface to the cavity and a second portion extending through the compliant dielectric material, a layer of insulation material formed along a sidewall of the first portion of the hole, and conductive material extending through the first and second portions of the hole and electrically coupled to the one contact pad.


