Buried Conductive Line in Semiconductor Isolation Structure

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Solution Overview

Problem

Current integrated circuit (IC) designs face challenges in routing flexibility and latch-up immunity due to limitations in transistor source connections and well strap area utilization, particularly in miniaturized semiconductor structures.

Innovation Solution

The semiconductor structure incorporates buried conductive lines within the isolation structure to electrically connect transistor sources, ensuring the top surface is level with or lower than the isolation structure, thereby enhancing routing flexibility and latch-up immunity while saving well strap area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If transistor sources are connected using conventional routing methods, then routing flexibility is limited, but device complexity is reduced

Engineering Contradiction:
Improverouting flexibilityVSAvoiddevice complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent embeds conductive lines within the isolation structure (shallow trench isolation), transitioning from surface-level routing to subsurface routing. This dimensional change allows conductive lines to be positioned at different depths, enabling flexible connection of transistor sources without adding lateral complexity to the device layout.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The conductive lines are nested within the isolation structure, specifically embedded in the shallow trench isolation material. This nesting approach allows the routing infrastructure to be integrated within existing device structures rather than adding separate external routing layers, thereby improving flexibility without proportionally increasing overall device complexity.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Productivity

If well strap area is reduced to increase logic circuit density, then logic circuit density is improved, but latch-up immunity deteriorates

Engineering Contradiction:
Improvelogic circuit densityVSAvoidlatch-up immunity
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent moves well connection functionality from the lateral plane (well straps at the surface) to the vertical dimension (conductive lines embedded at depth within isolation structures). This allows well connections to be established without consuming lateral well strap area, thereby maintaining latch-up immunity while increasing logic circuit density.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The isolation structure serves as an intermediary medium that hosts embedded conductive lines for well connections. Instead of directly using well straps at the surface, the patent uses these subsurface conductive lines as intermediaries to establish well connections, thereby decoupling the well connection function from lateral area consumption.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Productivity

If conventional routing methods are used, then device structure is simpler, but routing efficiency deteriorates

Engineering Contradiction:
Improverouting efficiencyVSAvoiddevice structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent implements routing at multiple vertical levels by embedding conductive lines within the isolation structure at controlled depths. This vertical stratification of routing paths allows for more efficient signal routing by providing additional dimensional freedom, improving routing efficiency without requiring excessively complex lateral routing schemes.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11114366B2Semiconductor structure with buried conductive line and method for forming the same
Publication Date: 2021.09.07 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US11114366B2 patent drawing
  • US11114366B2 patent drawing
  • US11114366B2 patent drawing

AI summary

A semiconductor structure is provided. The semiconductor structure includes a first well region over a substrate, and an isolation structure over the first well region. The semiconductor structure also includes a first transistor over the first well region, and a first buried conductive line over the first well region and electrically connected to a source structure of the first transistor. A top surface of the first buried conductive line is substantially level with or lower than a top surface of the isolation structure.