Communication Bus Self-Test Descriptors for Device Verification

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Solution Overview

Problem

Information handling systems face challenges in efficiently testing and verifying the functionality of devices connected to communication buses, particularly due to the lack of standardized self-test mechanisms that can be transparent to end users and compatible with various communication protocols.

Innovation Solution

The implementation of a system and method that includes a communication bus device with a configuration descriptor and a self-test descriptor, allowing for built-in self-tests to be initiated and managed by the information handling system, which detects and executes tests based on test information stored in the self-test descriptor, enabling device-specific testing without requiring additional local resources or third-party stacks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional communication bus devices are used without standardized self-test mechanisms, then device compatibility with various communication protocols is maintained, but testing efficiency and reliability are insufficient

Engineering Contradiction:
Improvedevice verification reliabilityVSAvoidtesting efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The device performs self-testing using built-in test logic and self-test descriptors stored in its memory. The device autonomously executes tests without requiring external test equipment or complex third-party stacks, thereby improving both reliability and testing efficiency simultaneously

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The self-test mechanism is designed to be compatible with multiple communication protocols (USB, PCI, PCI Express, etc.) through standardized descriptors that can be read by the information handling system. This universal approach allows the same self-test framework to work across different bus types without requiring protocol-specific testing infrastructure

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Productivity

If built-in self-tests are implemented with standardized descriptors, then testing efficiency and standardization are improved, but device complexity increases due to additional configuration and test descriptor structures

Engineering Contradiction:
Improvetesting efficiencyVSAvoiddevice structure complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The self-test descriptors are merged with the existing configuration descriptors that are already part of the standard communication protocol. The test descriptors are integrated into the device's existing memory structure and communication interface, allowing the information handling system to discover and execute tests through the same standardized bus protocols without adding separate complex testing infrastructure

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

Test logic and test descriptors are pre-programmed into the device during manufacturing. This preliminary action allows the device to perform self-testing autonomously without requiring complex real-time configuration or external test setup, thereby improving testing efficiency while keeping the added complexity minimal

Inventive Principle:
Principle #10Preliminary action

3Reliability

If third-party stacks and additional local resources are used for device testing, then comprehensive testing capabilities are achieved, but system resource consumption and complexity increase

Engineering Contradiction:
Improvedevice functionality verificationVSAvoidtesting system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The device performs self-testing using built-in test logic and self-test descriptors stored in its memory. The device autonomously executes tests without requiring external test equipment or complex third-party stacks, thereby improving both reliability and testing efficiency simultaneously

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The testing functionality is extracted from the information handling system and placed within the device itself. By moving test logic into the device, the system no longer needs to maintain complex third-party stacks or dedicated test resources, reducing overall system complexity while preserving comprehensive testing capabilities

Inventive Principle:
Principle #2Taking out (Extraction)

Data Source

PatentUS7865773B2System, method, and device including built-in self tests for communication bus device
Publication Date: 2011.01.04 DELL PROD LP
  • US7865773B2 patent drawing
  • US7865773B2 patent drawing
  • US7865773B2 patent drawing

AI summary

A method, device, and system including built-in self tests for a communication bus device is disclosed. In one form, a method of testing a device operable to be coupled to a communication port an information handling system includes accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system. The method can also include detecting a self-test descriptor associated with the configuration descriptor and testing a portion of the first device using test information associated with the self-test descriptor. The device and system can include logic to perform the methods described herein.