Byte-Level Memory Testing Skipping Failed Sectors
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Solution Overview
Problem
Existing memory testing processes are inefficient due to redundant testing, where once a byte in a sector fails, all other bytes in that sector are still tested, and if a sector fails one testing item, it is tested for all items, wasting time and reducing efficiency.
Innovation Solution
A method and apparatus that test memory byte by byte, stopping further testing within a sector once a byte fails and skipping to the next sector, with the option to record a failure flag to avoid re-testing the sector throughout the process, and implementing a repairing process if necessary.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If all bytes in a sector are tested successively, then complete testing coverage is achieved, but testing time increases significantly
Solution Approach 1:
The patent applies partial action by stopping the testing process once a byte in a sector fails, rather than completing all bytes in the sector. This is justified because a single failed byte indicates sector-level damage, making further testing of the same sector redundant. The principle balances testing coverage with time efficiency by performing only the necessary testing to identify failures.
2Reliability
If a sector is tested for all testing items, then comprehensive defect detection is achieved, but redundant testing occurs
Solution Approach 1:
The patent implements preliminary action by performing a preliminary test on each byte and immediately stopping sector testing once a failure is detected. This preliminary check prevents redundant testing of the same sector for subsequent testing items. The logic is: if a sector fails the first testing item, there is no need to test it for other items, as the sector is already identified as defective and will require repair.
3Reliability
If testing continues for all bytes in a sector, then complete sector validation is achieved, but testing resources are wasted
Solution Approach 1:
The patent converts the harmful effect of finding a failed byte into a beneficial stopping condition. Instead of continuing to test all bytes in a sector regardless of failures, the detection of a single failed byte becomes the trigger to stop testing and skip to the next sector. This transforms what would normally be seen as an incomplete test into a resource-saving decision, as the failure indicates the sector is already identified for repair.
Data Source
AI summary
A method and an apparatus for testing a memory are provided, where the memory includes a plurality of sectors each of which includes a plurality of bytes, and the testing is performed to the memory byte by byte. The method includes: during the testing, once a first byte in a first sector fails the testing, stopping testing the rest bytes in the first sector which haven't been tested, and skipping the testing to a second byte in a second sector. Accordingly, if one byte of the first sector fails the testing, the testing will be skipped to a second sector, and the remained bytes of the first sector will not be tested any more, and other testing items will not be implemented to the first sector within the whole testing flow. Therefore, redundant testing steps can be avoided and testing efficiency can be improved.