C-Shaped Illumination for Substrate Edge Defect Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for testing substrate edges for defects during the chamfering process in glass substrate manufacturing are inadequate, particularly in capturing clear images of the lower and upper portions of the edge, leading to interference issues and reduced clarity due to unchamfered surfaces.
Innovation Solution
A substrate edge test apparatus and method utilizing C-shaped and half C-shaped illumination sources with curved surfaces to irradiate light uniformly onto the edge portions, coupled with corresponding photographing portions to generate high-resolution images of the end, lower, and upper edge portions, allowing for effective defect analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If conventional illumination sources are used for substrate edge testing, then the testing process is simple, but the illuminance uniformity is poor and image clarity is reduced
Solution Approach 1:
The illumination source uses a C-shaped or half C-shaped cross-section structure with a curved surface facing the edge portion to be tested. This curved geometry enables the light to be distributed uniformly across the testing area, resolving the contradiction between illuminance uniformity and structural complexity by using a geometrically optimized form factor.
Solution Approach 2:
The illumination source is designed with different cross-sectional shapes (C-shaped or half C-shaped) tailored to specific testing regions (end portion, lower portion, upper portion of the edge). This localized optimization ensures that each region receives appropriate uniform illumination while maintaining overall system effectiveness.
2Measurement precision
If conventional photographing methods are used, then the system is simple, but the image clarity of lower and upper edge portions is poor due to interference
Solution Approach 1:
The photographing system is divided into multiple photographing portions, each dedicated to capturing a specific region of the edge (end portion, lower portion, upper portion). This segmentation allows each camera to be optimized for its specific viewing angle and lighting conditions, eliminating interference issues and improving overall image clarity.
Solution Approach 2:
Each photographing portion is specifically configured to capture a particular region of the edge portion with optimized lighting and viewing angles. The end portion is photographed by a dedicated illumination and photographing pair, as are the lower and upper portions, ensuring high-quality images without cross-interference.
3Manufacturing precision
If uniform illuminance is achieved through C-shaped illumination sources, then defect detection accuracy improves, but the manufacturing complexity of the apparatus increases
Solution Approach 1:
The C-shaped or half C-shaped cross-section design with curved surfaces provides uniform light distribution across the edge portion, significantly improving defect detection accuracy. While the geometry is specialized, the design is relatively simple to manufacture compared to the quality improvement it delivers.
Solution Approach 2:
The curved-surface illumination design serves multiple functions: it provides uniform illuminance, defines the lighting geometry for the photographing system, and creates consistent imaging conditions. This multi-functionality reduces the need for additional components despite the specialized shape.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection and evaluation of defects by minimizing interference and ensuring uniform illuminance, thereby improving the quality assessment of substrate edges and enhancing manufacturing process reliability.
Implementation Method 1
a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion
Data Source
AI summary
An apparatus for testing an edge portion of a substrate, includes a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion; and first to third photographing portions, respectively corresponding to the first to third illumination sources, wherein the first illumination source comprises a C-shaped cross-section and comprises a first curved surface facing the end portion of the edge portion, the second illumination source comprises a half C-shaped cross-section and comprises a second curved surface facing the lower portion of the edge portion, and the third illumination source comprises a half C-shaped cross-section and comprises a third curved surface facing the upper portion of the edge portion.