Cable Sample Electrode Stack for Reliable High-Voltage Measurement

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Solution Overview

Problem

Existing methods for analyzing the electrical properties of high voltage cables, particularly conductivity and space charge, are unreliable, especially when high voltages are applied.

Innovation Solution

A test setup comprising a first and second planar electrode with layers of a sample cable sandwiched between them, where the sample layers compress the stack and act as outer layers, ensuring homogeneous electric field distribution and controlling chemical diffusion.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If high voltage is applied to measure electrical conductivity and space charge, then measurement sensitivity is improved, but measurement reliability deteriorates

Engineering Contradiction:
Improvemeasurement sensitivityVSAvoidmeasurement reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent introduces an intermediary liquid medium (dielectric liquid) between the sample and electrodes to mediate the high voltage application. This liquid medium acts as a buffer that allows high voltage to be applied for sensitive measurements while preventing direct breakdown and ensuring measurement reliability through its stabilizing properties.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the physical state and environment parameters by immersing the sample in a dielectric liquid medium. This parameter change allows the system to operate at high voltages without direct contact between electrodes and sample, thereby maintaining both measurement sensitivity and reliability simultaneously.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If sample layers are compressed between electrodes to form a stack, then electrical contact is improved, but sample integrity may deteriorate

Engineering Contradiction:
Improveelectrical contactVSAvoidsample integrity
Core Design Contradiction:
ReliabilityVSStrength

Solution Approach 1:

The patent changes the physical state of the sample layers from loose to compressed by applying controlled pressure. This parameter change improves electrical contact between layers and electrodes while the gradual and controlled nature of compression preserves sample integrity through the dielectric liquid medium's protective effect.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This setup enables reliable measurements of electrical properties, including conductivity up to 30 kV/mm, by ensuring electrodes are surrounded by high voltage materials and controlling chemical composition and cross-contamination.

Implementation Method 1

The layers of the sample as outer layers of the sample compress the stack

Methodology Applied
Scientific EffectCompression: Compression

Implementation Method 2

ensuring homogeneous electric field distribution

Methodology Applied
Scientific EffectElectric field distribution: Electric Field

Implementation Method 3

measuring the electrical property comprises measuring the electric conductivity of the sample

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 4

measuring the electrical property comprises measuring the space charge of the sample

Methodology Applied
Scientific EffectSpace charge: Electrostatics

Data Source

PatentEP4560301A1Cable peeling encapsulation system
Publication Date: 2025.05.28 NEXANS SA
  • EP4560301A1 patent drawingFigure 1
  • EP4560301A1 patent drawingFigure 2
  • EP4560301A1 patent drawingFigure 3

AI summary

The present invention relates to a test setup comprising a first planar electrode, a second planar electrode, and layers of a sample of an electric cable. The present invention further relates to a test fixture comprising the test setup. The present invention also relates to a method of analyzing an electrical property of a sample of an electrical cable using the test fixture.