Calibrated Device for Low-Cost RF Test and Calibration
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The increasing complexity of testing integrated RF circuits and the need for dedicated, expensive test instruments to ensure the functionality of electronic products with multiple standards or technologies poses a significant challenge in identifying 'good' and 'bad' ICs during production and product testing.
Innovation Solution
A low-cost product test/calibration system utilizing a calibrated device that transmits or receives test signals to or from a device under test (DUT) for measuring or calibrating internal components, comprising external components and chips with analog and baseband signal processing circuits, allowing for cost-effective testing and calibration without the need for expensive dedicated instruments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If dedicated test instruments are used to test electronic products for each standard or technology, then measurement precision and reliability are improved, but device cost increases enormously
Solution Approach 1:
The patent implements a universal test instrument capable of testing multiple standards and technologies through a single device. The system uses a calibrated device with known parameters that can serve as a test source for various electronic product standards, eliminating the need for multiple dedicated test instruments. This multi-functional approach maintains measurement precision while significantly reducing device cost and complexity.
Solution Approach 2:
The patent creates a simplified model or copy of the test signal characteristics by using a calibrated device with known parameters. Instead of using expensive dedicated test instruments, the system uses a calibrated device that replicates the essential test signal properties needed for measurement, thereby reducing cost while maintaining adequate measurement precision through the use of calibration data.
2Adaptability or versatility
If multiple dedicated test instruments are used to support multiple standards or technologies, then adaptability is improved, but device cost increases enormously
Solution Approach 1:
The patent creates a single universal test instrument that can adapt to multiple standards and technologies. The calibrated device serves as a multi-functional test source that can be configured to test different electronic product standards through software control and calibration data, providing high adaptability without requiring multiple separate instruments, thereby avoiding the enormous cost increase that would result from purchasing multiple dedicated test instruments.
3Measurement precision
If conventional dedicated test instruments are used, then measurement precision is improved, but testing time increases due to sequential testing requirements
Solution Approach 1:
The patent enables continuous testing by using a calibrated device that can maintain test signal output without interruption. The system allows for seamless transition between different test items and standards without requiring reconfiguration or replacement of test instruments, thereby maintaining measurement precision while significantly improving test speed through continuous operation and eliminating sequential testing delays.
Solution Approach 2:
The patent performs calibration and test setup in advance by using pre-calibrated devices with known parameters. The calibration data is prepared beforehand, allowing the test instrument to quickly switch between different test configurations without time-consuming recalibration, thus maintaining measurement precision while reducing overall testing time through preliminary preparation of test parameters.
Data Source
AI summary
A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.