Calibrating Optical Phased Array Transceivers Using Multi-Wavelength Light

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Solution Overview

Problem

Current fabrication techniques for large-scale optical phased arrays (OPAs) on photonic integrated circuits (PICs) lack the necessary nanometer-level tolerances for alignment and calibration, particularly in satellite-based laser communication systems where rapid movement of transmitter and receiver assemblies limits calibration time.

Innovation Solution

A system and method for calibrating PIC-based optical phased arrays using multi-wavelength light to illuminate and measure the phases of antenna elements, with internal interferometric devices and a controller to adjust phase shifters, enabling precise alignment and phasing without external feedback loops.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If fabrication techniques are used for large-scale OPAs on PICs, then device integration is improved, but alignment precision deteriorates due to inability to achieve nanometer-level tolerances

Engineering Contradiction:
Improvedevice integrationVSAvoidalignment precision
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent applies preliminary action by performing calibration measurements before final operation. The system uses calibration sources and detectors to measure actual optical path lengths and phase shifts of each antenna element prior to deployment, then stores these measurements for use during operation. This pre-characterization approach allows the system to compensate for fabrication tolerances without requiring nanometer-level manufacturing precision.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent applies parameter changes by measuring and adjusting the optical path length parameters for each antenna element. The system varies the optical path length through phase shifters to achieve the desired phase relationships between elements, compensating for variations introduced during fabrication. This allows the system to achieve precise beamforming despite manufacturing tolerances.

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If static alignment is relied upon in manufactured PIC-based Tx/Rx assemblies, then device complexity is reduced, but calibration time increases due to limited adjustment capability in dynamic systems

Engineering Contradiction:
Improvealignment mechanismVSAvoidcalibration time
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The patent replaces mechanical alignment adjustment mechanisms with an optical/electronic phase control system. Instead of physically adjusting component positions to achieve alignment, the system uses phase shifters to electronically control the phase of light at each antenna element. This substitution eliminates complex mechanical adjustment mechanisms while enabling rapid electronic calibration and adaptation.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system performs preliminary calibration measurements to establish the actual optical characteristics of each element, then uses these pre-determined parameters for rapid electronic adjustment during operation. This approach avoids time-consuming mechanical realignment while maintaining precise control over the optical phase relationships.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If multi-wavelength calibration is performed, then measurement precision is improved, but calibration complexity increases due to need for multiple wavelength measurements

Engineering Contradiction:
Improvephase measurement accuracyVSAvoidcalibration system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies multi-functionality by using the same calibration hardware (sources and detectors) to perform multiple measurement functions across different wavelengths. The system uses multi-wavelength light from the calibration sources to simultaneously or sequentially measure optical path lengths and phase shifts for multiple antenna elements, extracting multiple parameters from a single calibration sequence. This reduces the need for separate dedicated measurement systems for each parameter.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for rapid and precise calibration of transmitter and receiver elements, enabling quick establishment of communication links and maintaining alignment in dynamic satellite-based systems, improving the accuracy and reliability of large-scale OPA systems.

Implementation Method 1

A technique for calibrating the line-of-sight and phasing of the transmitter and receiver elements is provided. In some embodiments, the disclosed systems and methods include an adjunct component within a PIC that includes all of the components used for calibration. These components may include internal interferometric measurement devices

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

Each waveguide may include a laser input/output and sixty-four waveguides that guide the light to sixty-four phase shifters and sixty-four antenna elements

Methodology Applied
Scientific EffectWaveguide (optics): Waveguide (optics)

Data Source

PatentUS11703739B2System and method for calibrating PIC-based optical phased array transmitter and receiver
Publication Date: 2023.07.18 RAYTHEON CO
  • US11703739B2 patent drawing
  • US11703739B2 patent drawing
  • US11703739B2 patent drawing

AI summary

A method includes illuminating a photonic integrated circuit (PIC) of a transmit aperture of a laser communication terminal and a PIC of a receive aperture of the laser communication terminal with multi-wavelength light, where each PIC includes multiple antenna elements forming an optical phased array (OPA). The method also includes determining light intensities of different wavelengths of the multi-wavelength light after the multi-wavelength light has passed through each PIC. The method further includes estimating phases of light associated with the antenna elements based on variations in the light intensities. In addition, the method includes adjusting one or more phase shifters of at least one of the PICs based on the estimated phases of light.