Calibration Clock Gating for Low-Power Memory Termination Control
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Solution Overview
Problem
Conventional calibration circuits in semiconductor devices unnecessarily consume current due to a constantly toggling clock, especially during idle states or data input/output operations, which affects the efficiency and accuracy of calibration operations.
Innovation Solution
A calibration circuit with a clock control unit that selectively supplies a clock to the calibration control unit based on the operation mode of the semiconductor device, ensuring the clock is only provided during calibration operations and not during data input/output operations, thereby reducing unnecessary power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a clock is constantly supplied to the calibration control unit, then the calibration operation can be continuously monitored and controlled, but unnecessary current is consumed during idle states and data input/output operations
Solution Approach 1:
The patent applies periodic action by enabling the clock signal to the calibration control unit only during specific calibration periods rather than continuously. The clock control unit selectively supplies the clock based on operation mode signals, creating a periodic activation pattern that matches the actual calibration needs while stopping during idle and data transfer periods, thus reducing power consumption while maintaining calibration reliability when needed.
2Measurement precision
If the calibration circuit operates continuously, then calibration accuracy can be maintained, but power consumption increases during idle periods
Solution Approach 1:
The patent implements dynamics by making the calibration control unit's operational state changeable based on system conditions. The clock control unit dynamically adjusts the clock supply to the calibration control unit according to operation mode signals, allowing the system to transition between active calibration monitoring and low-power idle states, thereby maintaining calibration accuracy when needed while minimizing energy loss during idle periods.
Data Source
AI summary
Calibration circuit, semiconductor memory device including the same, and operation method of the calibration circuit includes a calibration unit configured to generate a calibration code for controlling a termination resistance value, a calibration control unit configured to count a clock and allow the calibration unit to be enabled during a predetermined clock and a clock control unit configured to selectively supply the clock to the calibration control unit according to an operation mode of a semiconductor device employing the calibration circuit.