Calibration Interval Optimization via Risk Categorization
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Solution Overview
Problem
Current calibration methods for measurement devices in industrial sites involve short, uniform time intervals that are costly and may not adequately address the varying risks associated with measurement errors and criticality levels, leading to potential non-compliance and safety issues.
Innovation Solution
A method that defines discrete measurement error and criticality levels, assigns risk categories based on these, and adjusts calibration intervals using risk and criticality factors to optimize recalibration times, allowing for longer intervals for lower-risk devices and shorter intervals for higher-risk ones, with adjustments and repairs as needed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If short uniform calibration intervals are used for all devices, then compliance and safety are improved, but operational costs increase
Solution Approach 1:
The patent applies local quality by differentiating calibration intervals based on individual device characteristics. Instead of uniform calibration schedules, each device receives a tailored calibration interval determined by its specific measurement error levels and criticality levels, optimizing resource allocation while maintaining compliance.
Solution Approach 2:
The patent changes the parameter of calibration interval from a fixed uniform value to a variable value based on measurement error levels and criticality levels. This allows calibration intervals to be dynamically adjusted according to actual device performance and risk profiles, reducing unnecessary calibrations for low-risk devices while maintaining frequent calibration for high-risk devices.
2Loss of energy
If long calibration intervals are used to reduce costs, then operational costs decrease, but the risk of non-compliance increases
Solution Approach 1:
The patent transforms the calibration interval from a static long interval to a dynamic parameter that adjusts based on measured error levels and criticality assessments. Devices with stable performance can extend intervals, while devices showing degradation automatically trigger shorter intervals, maintaining compliance without unnecessary costs.
Solution Approach 2:
The patent implements feedback mechanisms where measurement error levels and criticality levels are continuously monitored and used to adjust future calibration intervals. This closed-loop system ensures that calibration frequency responds to actual device conditions, preventing non-compliance while optimizing costs.
3Ease of operation
If uniform calibration schedules are applied, then ease of operation is improved, but device complexity increases due to risk categorization requirements
Solution Approach 1:
The patent segments devices into distinct risk categories based on measurement error levels and criticality levels. This segmentation creates manageable groups that can be handled with standardized procedures within each category, reducing overall system complexity despite the initial classification requirements.
Solution Approach 2:
The patent introduces risk category as a new parameter that simplifies decision-making. Instead of evaluating each device individually with complex criteria, the risk category parameter provides a straightforward classification that directly determines calibration interval, making the system easier to operate once categorized.
Data Source
Figure 1
AI summary
A method of optimizing calibration time intervals between consecutive calibrations of a measurement device for measuring a quantity to be measured operated on a measurement site of an industrial site is described, which allows to increase safety and reduce costs, by defining discrete measurement error levels (Ei) for measurement errors (E) of the device determined during its calibration and discrete criticality levels (Cj) for criticalities (C) of the device determined based on a probability (P) of a of a defect of the device and a severity (S) of consequences of the defect, assigning a risk category (Rk) classifying a risk (R) involved in operating the device on the measurement site to each pair of one of the measurement error levels (Ei) and one of the criticality levels (Cj), determining the risk category (RC(D)) of the device based on its measurement error level (EL(D)) and its criticality level (CL(D)), and in case the risk category (RC(D)) of the device is lower or equal to a maximal allowable risk category (Rmax) performing a re-calibration of the device after a calibration time interval (T) given by a product of a given reference interval (TR) and a predetermined risk factor (rk) assigned to the risk category (RC(D)) of the device, wherein the risk factors (rk) are positive numbers larger than zero and smaller than a predetermined maximal value (rmax) larger than one, and wherein risk factors (rk) assigned to lower risk categories (Rk) are larger than risk factors (rk) assigned to higher risk categories (Rk).