Calibration Standard With Dynamic Holding Device
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing calibration standards for non-destructive measurement of thin layer thickness suffer from build-ups due to application or gluing issues, leading to inaccuracies in device calibration.
Innovation Solution
A calibration standard with a carrier plate and a standard applied thereon, featuring a holding device that allows the standard to move by at least one degree of freedom, ensuring tilt-free positioning of the measuring probe and minimizing errors through a twist-proof, spring-loaded design.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the standard is rigidly fixed to the carrier plate, then the structure is simple and stable, but the measuring probe cannot achieve tilt-free positioning, leading to measurement errors
Solution Approach 1:
The standard is made dynamically adjustable through a holding device with a degree of freedom, allowing it to tilt and rotate to accommodate the measuring probe's positioning requirements. This dynamic capability enables tilt-free measurement while maintaining structural simplicity through a single rotational degree of freedom around a horizontal axis.
Solution Approach 2:
The holding device is segmented into distinct functional components: a holding element that grips the standard, a rotational mechanism providing the degree of freedom, and a positioning system. This segmentation allows each component to perform its specific function efficiently while keeping the overall device structure manageable and understandable.
2Ease of manufacture
If the standard is applied by gluing or application methods, then the calibration standard can be manufactured, but build-ups occur leading to inaccuracies
Solution Approach 1:
The problematic application and gluing processes are completely removed from the manufacturing method. Instead of applying the standard to the carrier plate through adhesive methods that cause build-ups, the standard is mechanically held by the holding device, eliminating the source of manufacturing inaccuracies while preserving ease of manufacture through simple mechanical assembly.
3Productivity
If the measuring probe is manually repositioned multiple times during calibration, then multiple measurements can be taken, but positioning consistency is lost, increasing errors
Solution Approach 1:
The holding device provides visual and mechanical feedback to ensure consistent probe positioning. The degree of freedom mechanism allows the standard to self-align with the probe, and the twist-proof feature provides tactile feedback when proper alignment is achieved, ensuring positioning consistency across multiple measurements while maintaining high productivity.
Solution Approach 2:
The holding device with its degree of freedom enables the standard to self-align and self-position relative to the measuring probe. This self-service capability eliminates the need for manual repositioning adjustments, ensuring consistent positioning accuracy across multiple measurements while maintaining high measurement productivity.
4Adaptability or versatility
If the standard is fixed in a single position, then the structure is simple, but the measuring probe cannot be tilted or deflected for optimal measurement
Solution Approach 1:
The holding device incorporates a single degree of freedom that allows the standard to tilt and rotate dynamically. This dynamic capability provides the necessary adaptability for optimal measurement positioning while keeping the device structure relatively simple by limiting the degree of freedom to one rotational movement around a horizontal axis, rather than allowing full three-dimensional movement.
Data Source
AI summary
The invention relates to a calibration standard, especially for the calibration of devices for the non-destructive measurement of the thickness of thin layers with a carrier plate (16) of a basic material and a standard (17) applied on the carrier plate (16), said standard having the thickness of the layer at which the device is to be calibrated, wherein that a holding device (22) arranged on the basic body (12) of the calibration standard (11) receives at least the standard (17) to the basic body (12) such that upon setting a measuring probe of the device for the non-destructive measurement of thin layers onto the standard (17), its position will be changeable by at least one degree of freedom.