Calibration Substrate Switches for Embedded VNA Scattering Parameter Measurement
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Solution Overview
Problem
Vector network analyzers face challenges in non-destructive measurement of embedded devices under test, as each measurement requires accounting for the electrical periphery, making the process labor-intensive.
Innovation Solution
A calibration substrate with switches that allow for electrical connections between measurement ports and embedded devices, enabling direct connection to the vector network analyzer without mechanical detachment from the electronic circuit, using switches with identical properties to minimize calibration effort.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If mechanical detachment from the electronic circuit is performed for each measurement, then measurement precision is improved, but measurement time and labor intensity increase significantly
Solution Approach 1:
The calibration substrate is segmented into multiple independent calibration standards (open, short, load, thru) that can be individually selected and connected to the measurement port through switches, allowing precise measurements without requiring mechanical detachment of the entire electronic circuit
Solution Approach 2:
Switches are introduced as intermediary components between the measurement port and the calibration standards, enabling electrical connection and disconnection without mechanical detachment. The switches act as mediators that allow the measurement system to access different calibration standards while the electronic circuit remains connected
2Measurement precision
If the electrical periphery is taken into account during calibration for each measurement, then measurement accuracy is improved, but calibration complexity and effort increase
Solution Approach 1:
The calibration substrate is extracted as a separate, self-contained module with all necessary calibration standards integrated. This allows the calibration process to be performed independently of the electronic circuit's electrical periphery, simplifying calibration while maintaining accuracy
Solution Approach 2:
The calibration substrate serves multiple functions by incorporating all necessary calibration standards (open, short, load, thru) in a single universal structure. This multi-functional design eliminates the need for separate calibration procedures for different parts of the electronic circuit
Data Source
AI summary
A method for determining scattering parameters using a calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.