Semiconductor Memory CAM Data Programming via Column Address Increment
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Solution Overview
Problem
The existing semiconductor memory devices face increased data input time and memory capacity requirements due to the need to repeatedly store and read the same CAM data multiple times across multiple CAM cells, which prolongs test operations and necessitates larger test equipment.
Innovation Solution
A semiconductor memory device and programming method that includes a memory cell block with main and CAM cells, page buffers, a CAM data input mode detector, and a Y decoder to efficiently transfer and program CAM data into multiple columns, reducing the need for repeated data input by incrementing column addresses in a CAM data input mode.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the same CAM data is repeatedly inputted N times into CAM cells to improve reliability, then the reliability of stored data is improved, but the data input time increases and test operation time increases
Solution Approach 1:
The patent applies preliminary action by pre-organizing N copies of the same CAM data in advance within a single page buffer before programming. Instead of inputting data N times sequentially, the system prepares all N copies simultaneously in the page buffer, then programs them to N different CAM cell locations in one operation. This eliminates the repeated data input process while maintaining the reliability benefit of storing multiple copies.
Solution Approach 2:
The patent transitions from a time-dimensional approach (inputting data N times sequentially) to a spatial-dimensional approach (storing N copies simultaneously in different column locations). By using the column address dimension to differentiate between multiple copies of the same data, the system achieves parallel storage without repeated input operations, thus reducing data input time while maintaining data reliability.
2Reliability
If the same CAM data is repeatedly inputted N times into CAM cells, then the data reliability is improved, but the memory capacity of test equipment must be increased
Solution Approach 1:
The patent extracts the data replication function from the test equipment and relocates it to the semiconductor memory device itself. By implementing the multi-copy storage capability within the device's page buffer and programming logic, the system eliminates the need for test equipment to maintain large memory capacity for storing multiple copies of CAM data, while still achieving the reliability benefit of N-fold data storage.
Solution Approach 2:
The patent uses internal copying mechanisms within the semiconductor memory device to create N copies of the same CAM data in the page buffer, then programs these copies to N different CAM cell locations. This internal copying approach replaces the need for external test equipment to store and manage multiple data copies, thereby reducing the memory capacity requirements of test equipment while maintaining data reliability through multi-copy storage.
3Reliability
If the same CAM data is inputted multiple times to different chips during testing, then data reliability is verified, but the test operation time increases
Solution Approach 1:
The patent merges multiple data input operations into a single programming operation by preparing N copies of the same CAM data in one page buffer and programming them simultaneously to N different CAM cell locations across different columns. This consolidation of operations verifies data reliability across multiple storage locations in one test cycle rather than requiring separate input operations, thereby reducing test operation time while maintaining verification reliability.
Data Source
AI summary
A semiconductor memory device includes a memory cell block configured to include a plurality of main cells and a plurality of CAM cells, a plurality of page buffers configured to store data to be programmed into the memory cell block, and a Y decoder configured to transfer CAM data to respective page buffers, selected from among the plurality of page buffers, in response to a data determination signal and CAM column addresses whenever the CAM data is inputted in a CAM data input mode.


