Configurable Camera Metrology Mounting for Repeatable Multi-Test Setups

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Solution Overview

Problem

The existing optical testing equipment for small aperture cameras requires multiple dedicated test stations for different types and configurations, leading to increased equipment and maintenance costs, as well as space requirements due to the need for specific setups for each type of camera system.

Innovation Solution

A reconfigurable camera metrology apparatus that can perform multiple tests on various small aperture cameras by using a common configurable platform with movable stages and interchangeable accessory devices, allowing for adjustable performance characteristics such as Modulation Transfer Function (MTF) measurements, geometric imaging parameters, and stray light performance across a wide range of object distances and field angles.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple dedicated test stations are used for different types of small aperture cameras, then testing capability and measurement precision are improved, but device complexity and space requirements increase

Engineering Contradiction:
Improvetesting capabilityVSAvoidequipment configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent implements a universal test station with a reconfigurable optical platform that can perform multiple types of camera tests (MTF, distortion, vignetting, chromatic aberration, etc.) using a single integrated system. The platform includes interchangeable optical components and adjustable parameters that allow it to adapt to different camera types and test requirements, eliminating the need for multiple dedicated test stations while maintaining comprehensive testing capability

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The test station is divided into modular functional components including separate illumination sources, optical elements, sensors, and control systems that can be independently configured and re arranged. This segmentation allows the system to be reconfigured for different test types by rearranging or replacing specific modules rather than requiring entirely separate dedicated systems

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If multiple dedicated test stations are used for different types of small aperture cameras, then testing capability is improved, but maintenance costs and operational complexity increase

Engineering Contradiction:
Improvetesting capabilityVSAvoidmaintenance costs
Core Design Contradiction:
Adaptability or versatilityVSEase of repair

Solution Approach 1:

By consolidating multiple test functions into a single universal platform with standardized interfaces and common infrastructure, the system reduces the total number of systems requiring maintenance. The standardized modular design allows for easier repair and replacement of individual components rather than maintaining entirely separate dedicated systems

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If multiple dedicated test stations are used for different types of small aperture cameras, then specific test requirements are met, but floor space and equipment storage requirements increase

Engineering Contradiction:
Improvetest accuracyVSAvoidfloor space
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent merges multiple previously separate test stations into a single integrated universal test station. By combining the optical paths, control systems, and support infrastructure into one consolidated platform, the system maintains the testing accuracy of dedicated stations while occupying significantly less floor space and requiring reduced equipment storage

Inventive Principle:
Principle #5Merging (Combining)

4Device complexity

If a reconfigurable platform is used to perform multiple tests, then device complexity is reduced, but the ability to meet specific test requirements may be compromised

Engineering Contradiction:
Improveequipment configurationVSAvoidtest protocol accuracy
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The test platform incorporates dynamic reconfiguration capabilities through programmable control systems, adjustable optical elements, and interchangeable components that can be dynamically adjusted to match specific test requirements. This dynamic adaptability allows the single platform to reliably execute different test protocols with the same precision as dedicated stationary systems

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS11089292B2Configurable camera stimulation and metrology apparatus and method therefor
Publication Date: 2021.08.10 OPTIKOS CORP
  • US11089292B2 patent drawing
  • US11089292B2 patent drawing
  • US11089292B2 patent drawing

AI summary

A camera metrology apparatus including a base section, a drive section with independent drive axes, and an actuation platform having a camera mount, with a predetermined camera mount interface for a camera, and a camera stimulation source mount, with a predetermined stimulation source mount interface, and being coupled to one of the drive axes to generate relative motion between each interface effecting metrology measurement of the camera, wherein the actuation platform has a selectable configuration between different predetermined platform configurations, each with different predetermined mounting location characteristics changing a predetermined mounting location of the camera mount interface or stimulation source mount interface and effecting a different predetermined metrology measurement characteristic, and the camera mount and the camera stimulation source mount are arranged to define a repeatable relative position between the camera mount interface and stimulation source mount interface in each platform configuration and effect free selection between each platform configuration.