Cantilever Probe Structure for Warped PCB Contact Alignment
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Solution Overview
Problem
Existing electrical connection devices face challenges in accurately aligning probe contact positions due to warping or distortion of the circuit board, which affects the precision of inspections.
Innovation Solution
A probe design with a cantilever structure and an elastically deformable tension generating section that allows alignment of contact portions with an object to be inspected, even when the circuit board is warped or distorted, by absorbing warpage and strain through deformation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If a rigid probe structure is used to maintain contact position accuracy, then manufacturing precision is improved, but the probe cannot adapt to warped or distorted circuit boards
Solution Approach 1:
The probe structure transitions from a completely rigid design to a dynamic system where the arm portion can elastically deform. The tension generating section provides a controlled degree of freedom, allowing the probe to adapt its shape to match the warped circuit board surface while maintaining precise contact portion positioning through elastic recovery.
Solution Approach 2:
The rigidity parameter of the probe structure is changed by introducing the tension generating section with specific elastic properties. The arm portion's stiffness is optimized to provide sufficient rigidity for positioning accuracy while maintaining enough flexibility to accommodate circuit board warpage through controlled deformation.
2Adaptability or versatility
If the circuit board is made flexible to accommodate warpage, then adaptability to distortion is improved, but structural stability deteriorates
Solution Approach 1:
The probe is segmented into distinct functional sections: the joint portion that attaches to the circuit board, the arm portion that provides structural support and positioning, and the tension generating section that provides elastic adaptation. This segmentation allows each part to perform its specific function optimally while maintaining overall system stability.
Solution Approach 2:
The tension generating section acts as an intermediary element between the rigid arm portion and the warped circuit board. It mediates the interaction by providing controlled elastic deformation that absorbs the mismatch between the rigid probe structure and the distorted board surface, preventing stress concentration and maintaining stable contact.
3Adaptability or versatility
If a tension generating section with elastic deformation is added to the probe, then adaptability to warped circuit board is improved, but device complexity increases
Solution Approach 1:
The tension generating section is implemented as a thin, flexible elastic element that can be integrated into the probe structure. This flexible component provides the necessary adaptability to warped surfaces without requiring complex mechanical systems, actuators, or multiple moving parts, thus minimizing the increase in device complexity.
4Adaptability or versatility
If the arm portion is made longer to reach contact points on distorted surfaces, then adaptability is improved, but structural stability and positioning precision worsen
Solution Approach 1:
Instead of making the arm portion longer and more flexible, the solution uses controlled elastic deformation of the tension generating section to provide the necessary adaptability. This dynamic approach allows the probe to reach contact points on distorted surfaces while the elastic section's controlled flexibility maintains positioning precision through its restoring force.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise alignment of probe contact positions on a warped or distorted circuit board, ensuring accurate electrical signal transmission and reception during inspections.
Implementation Method 1
The tension generating section is elastically deformable so that the position of the second end varies in the first direction
Data Source
AI summary
A probe includes an arm portion with a contact portion at a tip of a free end protruding in a first direction in a cantilever structure; a support portion connected to the arm portion; a joint portion connected to the support portion; and a tension generating section. The tension generating section includes a first end connected to the support portion, and a second end located closer to the contact portion than the first end in the first direction, and that is separated from the support portion. The tension generating section is elastically deformable so that the position of the second end varies in the first direction.