Capacitance Measurement Circuit With Parasitic Charge Cancellation

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Solution Overview

Problem

Capacitance measurement applications are hindered by parasitic capacitances associated with sense plates, switches, and wiring, leading to performance degradation, particularly in charge transfer methods, which also suffer from non-linearity issues and require practical and economic implementation on standard CMOS integrated circuits.

Innovation Solution

The technique involves compensating for parasitic capacitances by transferring unwanted charge from a measured capacitor to a reference capacitor using a compensation capacitor or current mirror structure, allowing for precise removal of parasitic capacitance effects without physical changes to the sensor structure, enabling scaling and linear operation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If charge transfer method is used for capacitance measurement, then measurement capability is achieved, but parasitic capacitances degrade performance

Engineering Contradiction:
Improvecapacitance measurement accuracyVSAvoidparasitic capacitance effects
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent extracts and separates the parasitic capacitance effect from the total measured capacitance by performing a measurement without the sensor plate (or with sensor plate disconnected) to characterize CP, then subtracting this parasitic component from the total measurement to obtain the true sensor capacitance

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the configuration parameter of the measurement system by disconnecting or removing the sensor plate during a calibration phase to isolate and measure only the parasitic capacitance, then uses this parameter to compensate subsequent measurements

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If sensitivity is increased by reducing effective CM value, then measurement sensitivity improves, but parasitic capacitance effects become more significant

Engineering Contradiction:
Improvemeasurement sensitivityVSAvoidparasitic capacitance interference
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent implements a feedback mechanism where the measured parasitic capacitance value is used to compensate subsequent measurements, allowing the system to maintain high sensitivity while correcting for parasitic effects through software or circuit compensation

Inventive Principle:
Principle #23Feedback

3Measurement precision

If charge transfer cycles are performed to measure capacitance, then measurement is achieved, but non-linearity in charging capacitor degrades accuracy

Engineering Contradiction:
Improvecapacitance measurement accuracyVSAvoidcharging linearity
Core Design Contradiction:
Measurement precisionVSStability of the object's composition

Solution Approach 1:

The patent performs a greater number of charge transfer cycles than the minimum required, allowing the system to average out non-linear effects and achieve better precision through statistical convergence

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances sensitivity and practicality by isolating the measured capacitance from parasitic effects, allowing for effective integration into standard CMOS integrated circuits, reducing noise, and improving the scalability and linearity of capacitance measurement systems.

Implementation Method 1

Inherent parasitic capacitances associated with sense plates, switches, connections and wiring degrade performance in these applications

Methodology Applied
Scientific EffectParasitic capacitance: Parasitic Capacitance

Implementation Method 2

parasitic capacitance cancellation is handled by means of a current mirror structure

Methodology Applied
Scientific EffectCurrent mirror:

Data Source

PatentUS8659306B2Parasitic capacitance cancellation in capacitive measurement applications
Publication Date: 2014.02.25 AZOTEQ HLDG LTD
  • US8659306B2 patent drawing
  • US8659306B2 patent drawing
  • US8659306B2 patent drawing

AI summary

An integrated circuit for compensating for parasitic capacitance in a capacitive measuring apparatus wherein a capacitance measurement is done by repeatedly transferring charge from a capacitor to be measured to a reference capacitor.