Capacitive Measurement Device for Real-Time Clearance Monitoring
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Solution Overview
Problem
Current methods for measuring clearance between moving machine components require disassembly and offline inspection, lacking real-time indication of predetermined clearance during operation.
Innovation Solution
A subminiature capacitive measurement device with a probe comprising an elongated conductor, insulating core, conducting guard, and conducting sheath, which generates a signal when contacted by a moving surface, indicating when the clearance between two surfaces is less than a predetermined distance, allowing for real-time monitoring without machine disassembly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If solid metal rub pins are installed to measure clearance, then measurement capability is provided, but machine disassembly is required for inspection and the process is not real-time
Solution Approach 1:
The patent replaces the mechanical rub pin measurement system with a capacitive sensing system. The capacitive probe detects clearance changes through electrical field interaction without physical contact, eliminating the need for machine disassembly and enabling real-time monitoring during operation.
Solution Approach 2:
The patent introduces a capacitive probe as an intermediary sensing element that measures clearance through electrical capacitance changes. This intermediary device provides measurement capability without requiring direct mechanical contact or machine shutdown, bridging the gap between measurement accuracy and operational continuity.
2Reliability
If traditional tip clearance measurement systems are used, then clearance validation is achieved, but the process requires disassembly and is not cost-effective
Solution Approach 1:
The patent replaces complex mechanical measurement systems with a simpler capacitive sensing approach. The capacitive probe consists of basic electrical components (conductor, insulator, guard) that are easier to manufacture and install than traditional mechanical tip clearance measurement systems, while maintaining or improving measurement reliability.
Solution Approach 2:
The patent uses electrical field interaction to create a virtual copy of the physical clearance measurement process. Instead of physically measuring with mechanical tools, the capacitive probe replicates the measurement function through electrical capacitance changes, providing the same validation capability with reduced complexity and cost.
3Productivity
If a sensor contacts the surface for measurement, then real-time indication is provided, but surface damage may occur
Solution Approach 1:
The patent replaces mechanical contact-based sensing with electrical field-based capacitive sensing. The capacitive probe measures clearance through changes in electrical capacitance as the target surface approaches, eliminating mechanical contact and the associated risk of surface damage while maintaining real-time monitoring capability.
Solution Approach 2:
The patent introduces an electrical field as an intermediary between the probe and the target surface. This electrical field mediates the measurement process by detecting clearance changes through capacitance variation without requiring physical contact, thus protecting the target surface from damage while enabling continuous real-time monitoring.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate, real-time detection of clearance changes with minimal downtime, high sensitivity, and cost-effective implementation, validating traditional measurement systems while reducing the risk of surface damage.
Implementation Method 1
The device may be a subminiature capacitance sensor that produces a distinct voltage change when the sensor is physically contacted
Data Source
AI summary
A capacitive measurement device for indicating when two surfaces moving relative to each other are spaced less than a predetermined distance apart. The device comprises a probe having an elongated conductor, an insulating core, a conducting inner guard, an insulating interlayer, and a conducting sheath. A portion of the conductor, insulating core and conducting inner guard form a probe tip which extends beyond the insulating interlayer and conducting sheath by a predetermined offset. The probe is configured to extend from a first surface by a predetermined distance and to generate a signal when the tip is contacted by a second surface.