Capacitive Plate Dielectrometer for Low-Frequency Permittivity Testing

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Solution Overview

Problem

Existing methods for measuring dielectric properties, particularly permittivity, require large quantities of test materials and cumbersome equipment, making them expensive, time-consuming, and difficult to fabricate, especially for low-frequency testing.

Innovation Solution

A capacitive plate dielectrometer system that uses a small sample, such as a three-inch honeycomb cube, allowing measurements of all polarizations and electric field directions with one test sample, reducing material waste and labor time, and utilizing a calibration process that takes less time than traditional methods.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If large waveguide dimensions are used for low frequency permittivity testing, then measurement accuracy is improved, but device complexity and material quantity requirements increase

Engineering Contradiction:
Improvepermittivity measurement accuracyVSAvoidwaveguide setup complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical waveguide system with a capacitive plate measurement system. Instead of using large physical waveguide structures to guide electromagnetic waves, the invention uses parallel capacitor plates with a test sample placed between them. This substitution eliminates the need for complex waveguide geometry while maintaining the ability to measure permittivity through capacitance changes.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the measurement parameter from waveguide dimension-based electromagnetic wave propagation to direct capacitance measurement. By measuring the change in capacitance when a test sample is placed between capacitor plates, the system determines permittivity without requiring large physical dimensions. The measurement is based on electrical parameter changes rather than geometric constraints.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If large quantities of test material are used for low frequency testing, then measurement reliability is improved, but loss of substance and fabrication difficulty increase

Engineering Contradiction:
Improvemeasurement reliabilityVSAvoidtest material consumption
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent extracts only the essential portion of test material needed for the measurement. Instead of requiring large quantities of material to fill waveguides, the invention uses small test samples placed between capacitor plates. The essential measurement capability is maintained while removing the unnecessary bulk material, thereby reducing material consumption and fabrication complexity.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent segments the test material into small, manageable samples rather than requiring large continuous quantities. The capacitive plate system allows measurement of small test pieces by focusing the electric field directly on the sample between the plates, eliminating the need for large material quantities and simplifying sample fabrication and preparation.

Inventive Principle:
Principle #1Segmentation

3Measurement precision

If traditional waveguide methods are used for permittivity testing, then measurement accuracy is maintained, but loss of time for testing increases

Engineering Contradiction:
Improvepermittivity measurement accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces the time-consuming waveguide setup and measurement process with a simpler capacitive plate system. The substitution of electromagnetic wave propagation measurements with direct capacitance measurements using parallel plates significantly reduces the time required for sample preparation, positioning, and measurement while maintaining permittivity measurement accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate permittivity measurements with reduced material and equipment costs, easier specimen fabrication, and faster testing, while maintaining productivity and measurement accuracy across various electric field vector directions.

Implementation Method 1

Permittivity is a physical quantity that describes how an electric field affects and is affected by a dielectric medium, and it is determined by the ability of a material to polarize in response to the field and thereby reduce the field inside the material

Methodology Applied
Scientific EffectDielectric permittivity: Dielectric Permittivity

Implementation Method 2

test materials may be classified according to their conductivity or permittivity. Electrical conductivity is a measure of a material's ability to conduct an electric current

Methodology Applied
Scientific EffectElectric field: Electric Field

Data Source

PatentUS7479790B2Capacitive plate dielectrometer method and system for measuring dielectric properties
Publication Date: 2009.01.20 THE BOEING CO
  • US7479790B2 patent drawing
  • US7479790B2 patent drawing
  • US7479790B2 patent drawing

AI summary

A capacitive plate dielectrometer method and system is provided that is used to measure dielectric properties, such as permittivity, of a small sample test material at a low frequency. The capacitive plate dielectrometer method and system calibrates the capacitive plate dielectrometer with a plurality of standard dielectric materials and the sample test material is rotated in the capacitive plate dielectrometer to allow measurement of several electric field directions.