Capacitive Sensing Device Short Circuit Testing Method
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Solution Overview
Problem
Conventional short circuit testing methods for capacitive sensing devices are time-consuming and unable to meet user requirements for efficient testing of multiple sensing cells.
Innovation Solution
A capacitive sensing device with a short circuit testing method that couples sense lines and drive lines to a reference level, using a sensing circuit to read and compare resultant signals to determine short circuit conditions, allowing for rapid detection without additional testing equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If one capacitor element is used to perform short circuit test for lines of multiple sensing cells in parallel, then the testing coverage is improved, but the testing time becomes excessively long
Solution Approach 1:
The patent divides the testing process into multiple time slots, with each sensing cell being tested in a dedicated time slot. The controller sequentially activates each sensing cell and performs short circuit testing individually, rather than attempting to test all cells simultaneously. This segmentation of the testing process reduces the complexity of signal management and allows for more accurate individual cell testing while maintaining overall system efficiency.
2Reliability
If conventional parallel testing scheme is used for multiple sensing cells, then testing comprehensiveness is improved, but testing efficiency deteriorates
Solution Approach 1:
The patent implements preliminary action by having the controller sequentially activate and prepare each sensing cell before performing the actual short circuit testing. The controller activates a specific sensing cell, waits for the capacitive sensing device to stabilize, and then performs the testing. This preliminary activation and stabilization step ensures accurate testing results while maintaining an efficient sequential testing process that avoids the inefficiencies of simultaneous parallel testing.
Data Source
AI summary
A short circuit testing method for a capacitive sensing device including a plurality of sense lines and a plurality of drive lines includes: under a short circuit testing mode, coupling at least one first line in the sense lines and drive lines to a reference level; using a sensing circuit corresponding to a specific sense line to read out a testing resultant signal; and, comparing the testing resultant signal with a reference signal to determine whether a short circuit exists.