Thin Film Capacitor Dielectric Patch Taper Angle Breakdown Resistance

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Solution Overview

Problem

Thin film capacitors face dielectric breakdown due to mechanical stress and accumulated electric charge, which compromises their long-term reliability and durability.

Innovation Solution

Incorporating a dielectric patch member with a specific taper angle and area on the surface of the dielectric substance layer to control and concentrate electric charge, preventing rapid movement and accumulation that could lead to breakdown, along with a nucleus portion for enhanced formation and positioning, and varying relative permittivity to facilitate stress distribution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of stationary object

If the thickness of the dielectric substance layer is reduced to reduce capacitor profile, then the profile is reduced, but the withstanding voltage and leakage characteristics deteriorate

Engineering Contradiction:
Improvethickness of dielectric substance layerVSAvoidwithstanding voltage and leakage characteristics
Core Design Contradiction:
Length of stationary objectVSReliability

Solution Approach 1:

The patent introduces a dielectric patch member with specific material composition and crystalline structure at a localized region within the dielectric substance layer. This patch member has different local properties (higher withstanding voltage and better leakage characteristics) compared to the surrounding dielectric material, thereby improving overall reliability without increasing the total thickness of the dielectric layer.

Inventive Principle:
Principle #3Local quality

2Ease of operation

If the dielectric substance layer is subjected to mechanical deformation during use, then the piezoelectric properties are utilized, but mechanical stress accumulates and causes dielectric breakdown over time

Engineering Contradiction:
Improvepiezoelectric functionalityVSAvoiddurability against dielectric breakdown
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The dielectric patch member acts as an intermediary stress-distributing element within the dielectric substance layer. When mechanical deformation occurs, the patch member with its different mechanical properties (modulus, hardness) redistributes the stress, preventing stress concentration that would lead to dielectric breakdown, while still allowing the piezoelectric effect to function.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent pre-introduces the dielectric patch member into the dielectric substance layer before the capacitor is put into service. This patch member serves as a preventive measure that cushions against future mechanical stress accumulation, thereby preventing dielectric breakdown before it can occur during long-term operation.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The configuration effectively suppresses dielectric breakdown and maintains the properties of thin film capacitors over a long period, ensuring reliable performance.

Implementation Method 1

The dielectric patch member can function as a center for controlling (leaking, adjusting) charge or stress accumulated in the dielectric substance layer

Methodology Applied
Scientific EffectCharge concentration and control: Electrostatics

Implementation Method 2

The electric charge concentrated in the dielectric patch member is released as interfacial current that is transmitted through an interface between the dielectric patch member and the dielectric substance layer

Methodology Applied
Scientific EffectInterfacial current transmission: Conduction (electrical)

Implementation Method 3

the dielectric substance layer (dielectric material) of a capacitor has piezoelectric properties, and thus mechanical deformation occurs in the dielectric substance layer through the use of the element

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Data Source

PatentUS9818539B2Thin film capacitor with improved resistance to dielectric breakdown
Publication Date: 2017.11.14 TDK CORP
  • US9818539B2 patent drawing
  • US9818539B2 patent drawing
  • US9818539B2 patent drawing

AI summary

A thin film capacitor includes a lower electrode layer, an upper electrode layer, and a dielectric substance layer provided between the lower electrode layer and the upper electrode layer. A dielectric patch member formed of a dielectric material is formed on a surface of the dielectric substance layer on an upper electrode layer side, a cross-sectional structure of the dielectric patch member has a taper angle of 1 to 25 degrees in a cross section perpendicular to the dielectric substance layer, the taper angle being an angle formed by (1) a tangential line tangent to an end portion of the dielectric patch member at a position that is 50% of a maximum height of the dielectric patch member and (2) a line being an interface between the dielectric substance layer and the upper electrode layer, and an area of the dielectric patch member is 100 to 900000 μm2.