Semiconductor Capacitor Pillar Support Structure Against Tipping

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Solution Overview

Problem

As semiconductor structures miniaturize, capacitors face challenges in maintaining sufficient storage capacity without tipping, which affects product yield and performance.

Innovation Solution

A semiconductor structure is designed with a substrate featuring lower electrode pillars, a dielectric layer covering the pillars, a first upper electrode, and a first support layer that exposes a peripheral region of the upper electrode, preventing the pillars from tipping.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If capacitor height is increased to ensure sufficient storage capacity, then storage capacity is improved, but structural stability deteriorates causing pillars to tip

Engineering Contradiction:
Improvestorage capacityVSAvoidstructural stability
Core Design Contradiction:
Quantity of substanceVSStability of the object's composition

Solution Approach 1:

The support layer is segmented into multiple parts: a first support layer covering the sidewall of the lower electrode pillar, and a second support layer covering the top surface. This segmentation provides distributed support at different heights, preventing pillar tipping while maintaining storage capacity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The support layer acts as an intermediary structural element between the substrate and the upper electrode, providing mechanical stabilization to the tall lower electrode pillar without interfering with the capacitor's electrical function or storage capacity.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Quantity of substance

If capacitor height is increased to meet storage requirements, then storage capacity is improved, but manufacturing precision deteriorates due to tipping

Engineering Contradiction:
Improvestorage capacityVSAvoidpillar alignment precision
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The support layer is formed preliminarily before final electrode assembly, providing preemptive structural reinforcement to the lower electrode pillar. This preliminary stabilization ensures that subsequent manufacturing steps can proceed with high precision without the pillar tipping or deforming.

Inventive Principle:
Principle #10Preliminary action

3Stability of the object's composition

If support structure is added to prevent tipping, then structural stability is improved, but device complexity increases

Engineering Contradiction:
Improvestructural stabilityVSAvoidcapacitor structure complexity
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The support layer serves multiple functions simultaneously: it provides mechanical stabilization to prevent tipping, acts as an isolation layer between electrodes, and maintains structural integrity during manufacturing. This multi-functionality avoids adding separate dedicated support components, thereby limiting complexity increase.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The support layer is formed from the same dielectric material as the isolation layer, creating a homogeneous structure. This material homogeneity simplifies the manufacturing process and reduces the number of different material types that need to be managed, thereby limiting complexity increase.

Inventive Principle:
Principle #33Homogeneity

Data Source

PatentUS12211893B2Semiconductor structure and manufacturing method thereof
Publication Date: 2025.01.28 CHANGXIN MEMORY TECH INC
  • US12211893B2 patent drawing
  • US12211893B2 patent drawing
  • US12211893B2 patent drawing

AI summary

The present disclosure relates to the technical field of semiconductors, and provides a semiconductor structure and a manufacturing method thereof. The semiconductor structure includes: a substrate, including a plurality of lower electrode pillars that are arranged at intervals; a dielectric layer, at least partially covering a sidewall of each of the lower electrode pillars; a first upper electrode, covering a surface of the dielectric layer; a first support layer, located above the plurality of lower electrode pillars, the dielectric layer, and the first upper electrode, wherein the first support layer at least exposes a peripheral region of a part of the first upper electrode.