Capture IR Drop Analysis Through Critical Circuit Block Screening
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Solution Overview
Problem
Existing circuit design methods face inefficiencies in analyzing IR drop, leading to prolonged analysis times and inadequate representation of vector analysis, hindering comprehensive evaluation of capture IR drop in circuits.
Innovation Solution
A capture IR drop analyzer and method that analyzes circuit blocks corresponding to bump current sources, calculates critical circuit blocks based on current demand values, and evaluates clock tree architectures to obtain design structure adjustments, reducing analysis time and comprehensively assessing voltage drop risks.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If comprehensive IR drop analysis is performed on the entire circuit, then measurement precision and reliability are improved, but loss of time increases significantly
Solution Approach 1:
The circuit is divided into multiple circuit blocks, each corresponding to a bump current source. The analysis focuses on identifying and evaluating critical circuit blocks rather than analyzing the entire circuit uniformly. This segmentation allows the system to maintain measurement precision for critical areas while significantly reducing overall analysis time by excluding non-critical regions from detailed examination.
Solution Approach 2:
Different analysis depths are applied to different circuit blocks based on their criticality. Critical circuit blocks that contribute significantly to capture IR drop undergo detailed analysis, while non-critical blocks receive minimal or no analysis. This local quality approach ensures that measurement precision is concentrated where it is most needed, optimizing the balance between accuracy and analysis time.
2Reliability
If detailed analysis of all circuit blocks is performed, then reliability of IR drop evaluation is improved, but productivity decreases
Solution Approach 1:
The system performs preliminary analysis to identify critical circuit blocks before conducting detailed IR drop evaluation. By pre-screening circuit blocks and selecting only those that contribute significantly to capture IR drop, the system ensures reliable evaluation of critical areas while avoiding wasteful analysis of non-critical blocks, thus improving overall design productivity.
Solution Approach 2:
Instead of performing exhaustive analysis on all circuit blocks, the system applies partial action by focusing only on critical circuit blocks that have significant impact on capture IR drop. This selective approach maintains evaluation reliability for critical areas while substantially improving productivity by reducing the scope of detailed analysis.
3Measurement precision
If vector analysis is expanded to cover all circuit areas, then measurement precision is improved, but the representativeness of the analysis vector deteriorates due to dilution with non-critical data
Solution Approach 1:
The system extracts and isolates critical circuit blocks that contribute significantly to capture IR drop, separating them from non-critical circuit areas. By taking out only the relevant critical components for detailed analysis, the system maintains high measurement precision and preserves the representativeness of the analysis vector, avoiding dilution with non-critical data that would reduce information quality.
Data Source
AI summary
A capture IR drop analyzer and an analyzing method thereof are provided. The capture IR drop analyzing method includes: receiving circuit layout information and package model information of a circuit; analyzing a plurality of circuit blocks respectively corresponding to a plurality of bump current sources according to the circuit layout information and the package model information; calculating at least one critical circuit block according to each of the bump current sources and a current demand value of each of the corresponding circuit blocks; and analyzing a clock tree architecture of the at least one critical circuit block to obtain design structure adjustment information.