CARIBE Slanted Structure Fabrication via Dual Gas Injection

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Solution Overview

Problem

Current etching processes, such as ion beam etching (IBE), reactive ion beam etching (RIBE), and chemically assisted ion beam etching (CAIBE), are inadequate for reliably fabricating high symmetrical slanted structures, particularly in exotic materials like silicon nitride and inorganic metal oxides, due to limitations in controlling etching selectivity, etch rate, and profile precision.

Innovation Solution

The chemically assisted reactive ion beam etch (CARIBE) technique is employed, which involves injecting reactive gases into a reactive ion source generator to form a plasma, extracting reactive ions to create a collimated beam, and using a gas ring to inject additional reactive gases onto the material layer, allowing for precise control of etching parameters to form slanted surface-relief structures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional ion beam etching (IBE) or reactive ion beam etching (RIBE) is used, then etching can be performed on material layers, but the etching selectivity, etch rate, and profile precision cannot be reliably controlled for high symmetrical slanted structures in exotic materials

Engineering Contradiction:
Improveprofile precision of slanted structuresVSAvoidreliability of fabricating slanted structures in exotic materials
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The etching process is segmented into two independent gas injection systems: a first reactive gas injected into the ion source generator to form the ion beam, and a second reactive gas injected onto the material layer surface. This segmentation allows independent optimization of ion beam characteristics and surface chemistry, enabling precise control over etching selectivity and profile for slanted structures in exotic materials.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A second reactive gas acts as an intermediary chemical agent that enhances the etching process by reacting with etched material on the surface. This intermediary gas provides additional chemical assistance that improves etching selectivity and profile control without interfering with the ion beam generation, enabling reliable fabrication of slanted structures in exotic materials like silicon nitride and metal oxides.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If existing etching methods are used, then some etching can be achieved, but the desired etching selectivity, etch rate, and profile cannot be simultaneously achieved

Engineering Contradiction:
Improveetch rateVSAvoidetching selectivity and profile control
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The etching process separates ion beam generation (controlling physical sputtering and etch rate) from surface chemistry (controlling selectivity and profile through second gas injection). This segmentation allows independent optimization: ion beam parameters control etch rate while second gas composition and flow control selectivity and profile, enabling simultaneous achievement of high productivity and manufacturing precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system enables independent adjustment of multiple parameters: first gas type and flow rate control ion beam characteristics and etch rate, while second gas type, flow rate, and injection timing control chemical etching contribution, selectivity, and profile. This multi-parameter control allows simultaneous optimization of etch rate and manufacturing precision for slanted structures.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The CARIBE process enables the reliable fabrication of slanted structures with precise control over etching selectivity, etch rate, and profile, effectively addressing the limitations of existing methods and achieving desired features in various materials, including silicon nitride and inorganic metal oxides.

Implementation Method 1

generating a plasma including reactive ions in the reactive ion source generator

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

generating a plasma including reactive ions

Methodology Applied
Scientific EffectIonization: Ionisation

Implementation Method 3

extracting at least some of the reactive ions from the plasma to form a collimated reactive ion beam

Methodology Applied
Scientific EffectElectrostatic acceleration: Electrostatics

Implementation Method 4

the collimated reactive ion beam and the second reactive gas etch the material layer both physically and chemically

Methodology Applied
Scientific EffectIon beam sputtering: Sputtering

Implementation Method 5

injecting a second reactive gas onto the material layer. The collimated reactive ion beam and the second reactive gas etch the material layer both physically and chemically

Methodology Applied
Scientific EffectChemical etching: Chemical Bonding

Data Source

PatentUS10684407B2Reactivity enhancement in ion beam etcher
Publication Date: 2020.06.16 META PLATFORMS TECHNOLOGIES LLC
  • US10684407B2 patent drawing
  • US10684407B2 patent drawing
  • US10684407B2 patent drawing

AI summary

Techniques for fabricating a slanted structure are disclosed. In one embodiment, a method of fabricating a slanted structure in a material layer includes injecting a first reactive gas into an reactive ion source generator, generating a plasma that includes reactive ions in the reactive ion source generator, extracting at least some of the reactive ions from the plasma to form a collimated reactive ion beam towards the material layer, and injecting a second reactive gas onto the material layer. The collimated reactive ion beam and the second reactive gas etch the material layer both physically and chemically to form the slanted surface-relief structure.